G. N. Kozhemyakin, S. A. Kiiko, A. V. Kiiko, V. V. Artemov, I. S. Volchkov
{"title":"Bi Nanostructures Obtained on Si Substrates by Thermal Evaporation","authors":"G. N. Kozhemyakin, S. A. Kiiko, A. V. Kiiko, V. V. Artemov, I. S. Volchkov","doi":"10.1134/S1063774524602077","DOIUrl":null,"url":null,"abstract":"<p>Low dimension Bi structures were obtained on Si(100) substrates by thermal evaporation in Ar at 10‒20 s deposition time. The sizes and distribution density of Bi nano- and microcrystals were determined by computer processing of electron SEM-images. The nanocrystal density was larger than the microcrystal density by a factor of 260. The decrease of the nanocrystal density by a factor of 2 with the increase of their sizes was observed with the increase up to 20 s deposition time. X-ray diffraction analysis has revealed oxide layers on Bi nanocrystals and the Si substrate surface. The decrease of Bi nanocrystals sizes and the increase of their density on the Si substrates as compared of deposition on glassy carbon substrates was established.</p>","PeriodicalId":527,"journal":{"name":"Crystallography Reports","volume":"69 6","pages":"939 - 944"},"PeriodicalIF":0.6000,"publicationDate":"2025-02-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Crystallography Reports","FirstCategoryId":"88","ListUrlMain":"https://link.springer.com/article/10.1134/S1063774524602077","RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"CRYSTALLOGRAPHY","Score":null,"Total":0}
引用次数: 0
Abstract
Low dimension Bi structures were obtained on Si(100) substrates by thermal evaporation in Ar at 10‒20 s deposition time. The sizes and distribution density of Bi nano- and microcrystals were determined by computer processing of electron SEM-images. The nanocrystal density was larger than the microcrystal density by a factor of 260. The decrease of the nanocrystal density by a factor of 2 with the increase of their sizes was observed with the increase up to 20 s deposition time. X-ray diffraction analysis has revealed oxide layers on Bi nanocrystals and the Si substrate surface. The decrease of Bi nanocrystals sizes and the increase of their density on the Si substrates as compared of deposition on glassy carbon substrates was established.
期刊介绍：
Crystallography Reports is a journal that publishes original articles short communications, and reviews on various aspects of crystallography: diffraction and scattering of X-rays, electrons, and neutrons, determination of crystal structure of inorganic and organic substances, including proteins and other biological substances; UV-VIS and IR spectroscopy; growth, imperfect structure and physical properties of crystals; thin films, liquid crystals, nanomaterials, partially disordered systems, and the methods of studies.
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