{"title":"Modelling undulators in ray tracing simulations.","authors":"Manuel Sanchez Del Rio, Juan Reyes-Herrera","doi":"10.1107/S1600577525000190","DOIUrl":null,"url":null,"abstract":"<p><p>We introduce a model that can accurately simulate radiation from undulator sources for ray tracing applications. It incorporates several key effects relevant to fourth-generation synchrotron sources, such as electron emittance, energy spread, and diffraction-limited beam size. This code has been developed as part of SHADOW4, the latest version of the widely used SHADOW X-ray optics ray tracing program. The approach relies on calculating the field distribution in the far field, which determines the ray divergences. The integration of existing models for electron energy spread is also addressed. Rays sampled at the source follow a size distribution derived by backpropagating the far-field radiation. These models are detailed, and several examples are provided.</p>","PeriodicalId":48729,"journal":{"name":"Journal of Synchrotron Radiation","volume":" ","pages":"340-354"},"PeriodicalIF":2.5000,"publicationDate":"2025-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11892896/pdf/","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Synchrotron Radiation","FirstCategoryId":"101","ListUrlMain":"https://doi.org/10.1107/S1600577525000190","RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"2025/2/13 0:00:00","PubModel":"Epub","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
We introduce a model that can accurately simulate radiation from undulator sources for ray tracing applications. It incorporates several key effects relevant to fourth-generation synchrotron sources, such as electron emittance, energy spread, and diffraction-limited beam size. This code has been developed as part of SHADOW4, the latest version of the widely used SHADOW X-ray optics ray tracing program. The approach relies on calculating the field distribution in the far field, which determines the ray divergences. The integration of existing models for electron energy spread is also addressed. Rays sampled at the source follow a size distribution derived by backpropagating the far-field radiation. These models are detailed, and several examples are provided.
期刊介绍：
Synchrotron radiation research is rapidly expanding with many new sources of radiation being created globally. Synchrotron radiation plays a leading role in pure science and in emerging technologies. The Journal of Synchrotron Radiation provides comprehensive coverage of the entire field of synchrotron radiation and free-electron laser research including instrumentation, theory, computing and scientific applications in areas such as biology, nanoscience and materials science. Rapid publication ensures an up-to-date information resource for scientists and engineers in the field.
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