Synchronous state judgment arbiter PUF circuit design based on FPGA

IF 1.9 3区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Junyang Chen , Ziyu Zhou , Pengjun Wang , Gang Li
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引用次数: 0

Abstract

The physical unclonable function (PUF) leverages the inherent randomness of hardware to generate unique identity identifiers or keys, offering a viable solution to the potential information leakage risks in internet of things (IoT) devices. However, the stability of PUFs can affect their practical application. In light of this, this paper proposes a high-stability arbiter PUF (APUF) circuit using a synchronous state judgment mechanism. Firstly, a path selection module is constructed using the two-to-one selector unit of the field programmable gate array (FPGA) as a random deviation source to generate signal delay differences. Then, a multi-arbiter judgment and mask error correction circuit is designed to detect and correct unstable response bits, enhancing the stability of the APUF. Finally, an experimental platform is built, and the test results show that the design not only significantly improves the stability of the APUF but also maintains good randomness and uniqueness.
基于FPGA的同步状态判断仲裁器PUF电路设计
物理不可克隆功能(PUF)利用硬件固有的随机性来生成唯一的身份标识符或密钥,为物联网设备中潜在的信息泄露风险提供了可行的解决方案。然而,PUFs的稳定性会影响其实际应用。鉴于此,本文提出了一种采用同步状态判断机制的高稳定仲裁PUF (APUF)电路。首先,利用现场可编程门阵列(FPGA)的二对一选择器单元作为随机偏差源构建路径选择模块,产生信号延迟差;然后,设计了多仲裁器判断和掩码纠错电路来检测和纠正不稳定的响应位,提高了APUF的稳定性。最后搭建了实验平台,测试结果表明,该设计不仅显著提高了APUF的稳定性,而且保持了良好的随机性和唯一性。
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来源期刊
Microelectronics Journal
Microelectronics Journal 工程技术-工程:电子与电气
CiteScore
4.00
自引率
27.30%
发文量
222
审稿时长
43 days
期刊介绍: Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems. The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc. Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.
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