Yinfeng Long, Saiyu Bu, Han Chen, Kai Liu, Xin Zhou, Shiyu Zhang, Xiaotian Zhang, Teng Zhang, Changxin Chen, Wugang Liao, Kian Ping Loh, Lin Wang
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引用次数: 0
Abstract
Layered β′-In2Se3 has garnered significant attention due to its intriguing multiferroic properties. Until now, most studies have focused on a material-level understanding, with limited exploration of device-level properties. This work systematically investigates the in-plane resistive switching behavior of β′-In2Se3. Besides resistive switching resulting from ferroelectric polarization reversal, the critical role of defect migration is unveiled in determining the overall electrical characteristics of β′-In2Se3 devices. Specifically, we elucidate the contribution of electric-field-induced Se vacancy migration to resistive switching through time-dependent current evolution, in situ electric force microscopy, and density functional theory calculations. By considering the interplay between free carriers, bound charges, and mobile defects, a comprehensive physical picture of the complex resistive switching behavior of β′-In2Se3 devices is established. This work provides crucial insights into understanding and manipulating the resistive switching behavior of 2D vdW ferroelectric devices.
期刊介绍:
Nano Letters serves as a dynamic platform for promptly disseminating original results in fundamental, applied, and emerging research across all facets of nanoscience and nanotechnology. A pivotal criterion for inclusion within Nano Letters is the convergence of at least two different areas or disciplines, ensuring a rich interdisciplinary scope. The journal is dedicated to fostering exploration in diverse areas, including:
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