Revealing Resistive Switching of Phase Transitions in an Al-Doped Single Crystal of VO2 by DC and Pulsed Electrical Measurements

IF 2.8
Larisa Patlagan, George M. Reisner, Bertina Fisher
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Abstract

The simple phase diagram of pure VO2 consisting of an insulating monoclinic M1 phase and a metallic tetragonal R phase with a steep insulator-metal-transition (IMT) at TIMT = 340 K, is enriched by two additional insulating phases, a triclinic (T) and a monoclinic (M2) and multiple phase transitions, when strained or doped with M3+ions (M = Ga, Al, Cr, Fe, Mg). Under low-current R(T) measurements, the T(M1 → M2) and IMT are the only once detected by X-ray diffraction that show reproducible resistive switching (RS) and hysteresis typical of first-order transitions. Following the surprising detection of the RS associated with the M1→T transition induced by a high electric field in Ga-, Al-, and Cr-doped VO2 crystals, we attempted to uncover those associated with additional transitions in Al-doped VO2 nanostructures, as reported by Strelcov et al., Nano Letters 2012. Reported herein is the investigation of a single crystal of nominal Al0.01V0.99O2 composition, by repeated direct current (DC) and pulsed IV measurements at fixed ambient temperatures below and at room temperature (RT). RS associated with the various phase transitions appeared in the nonlinear I(V) regime induced by self-heating (Joule heating), including all those that are absent under low-electric-current measurements.

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用直流和脉冲电测量揭示掺铝VO2单晶相变的电阻性开关
纯VO2的简单相图由绝缘单斜相M1和金属四方相R组成,在TIMT = 340 K时具有陡峭的绝缘体-金属转变(IMT),当应变或掺杂M3+离子(M = Ga, Al, Cr, Fe, Mg)时,增加了两个额外的绝缘相,三斜相(T)和单斜相(M2)和多个相变。在低电流R(T)测量下,T(M1→M2)和IMT是唯一一次被x射线衍射检测到显示可再现的电阻开关(RS)和一阶跃迁典型的滞后。在高电场诱导下,在Ga、Al和cr掺杂的VO2晶体中发现了与M1→T跃迁相关的RS,随后,我们试图揭示与Al掺杂的VO2纳米结构中其他跃迁相关的RS,如Strelcov等人在《纳米快报》(Nano Letters) 2012年所报道的那样。本文报道了一种标称Al0.01V0.99O2组成的单晶,通过在固定环境温度下和室温(RT)下的反复直流(DC)和脉冲IV测量进行了研究。与各种相变相关的RS出现在由自热(焦耳加热)引起的非线性I(V)状态中,包括所有在低电流测量下不存在的相变。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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