{"title":"A multi-fidelity transfer learning strategy for surface deformation measurement of large reflector antennas","authors":"Zihan Zhang, Qian Ye, Na Wang, Guoxiang Meng","doi":"10.1007/s10686-025-09980-0","DOIUrl":null,"url":null,"abstract":"<div><p>As the observation frequency of large-aperture antennas increases, the requirements for measuring main reflector deformation have become more stringent. Recently, the rapid development of deep learning has led to its application in antenna deformation prediction. However, achieving high accuracy requires a large number of high-fidelity deformation samples, which is often challenging to obtain. To address these problems, this paper establishes a high-accuracy antenna surface deformation measurement model based on a multi-fidelity transfer learning neural network (MF-TLNN). Firstly, a low-fidelity surrogate model is constructed using a large number of simulation deformation samples to ensure its robustness. Secondly, the MF-TLNN structure is designed and trained using a small number of high-fidelity samples obtained from actual measurements of the main reflector deformation via out-of-focus (OOF) holography method. Thirdly, a Zernike correction module is utilized to provide additional constraints and ensure the stability of the results. Experimental results show that the proposed method can closely approximate radio holography measurements in terms of accuracy and is almost real-time in terms of speed.</p></div>","PeriodicalId":551,"journal":{"name":"Experimental Astronomy","volume":"59 1","pages":""},"PeriodicalIF":2.7000,"publicationDate":"2025-02-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Experimental Astronomy","FirstCategoryId":"101","ListUrlMain":"https://link.springer.com/article/10.1007/s10686-025-09980-0","RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ASTRONOMY & ASTROPHYSICS","Score":null,"Total":0}
引用次数: 0
Abstract
As the observation frequency of large-aperture antennas increases, the requirements for measuring main reflector deformation have become more stringent. Recently, the rapid development of deep learning has led to its application in antenna deformation prediction. However, achieving high accuracy requires a large number of high-fidelity deformation samples, which is often challenging to obtain. To address these problems, this paper establishes a high-accuracy antenna surface deformation measurement model based on a multi-fidelity transfer learning neural network (MF-TLNN). Firstly, a low-fidelity surrogate model is constructed using a large number of simulation deformation samples to ensure its robustness. Secondly, the MF-TLNN structure is designed and trained using a small number of high-fidelity samples obtained from actual measurements of the main reflector deformation via out-of-focus (OOF) holography method. Thirdly, a Zernike correction module is utilized to provide additional constraints and ensure the stability of the results. Experimental results show that the proposed method can closely approximate radio holography measurements in terms of accuracy and is almost real-time in terms of speed.
期刊介绍:
Many new instruments for observing astronomical objects at a variety of wavelengths have been and are continually being developed. Furthermore, a vast amount of effort is being put into the development of new techniques for data analysis in order to cope with great streams of data collected by these instruments.
Experimental Astronomy acts as a medium for the publication of papers of contemporary scientific interest on astrophysical instrumentation and methods necessary for the conduct of astronomy at all wavelength fields.
Experimental Astronomy publishes full-length articles, research letters and reviews on developments in detection techniques, instruments, and data analysis and image processing techniques. Occasional special issues are published, giving an in-depth presentation of the instrumentation and/or analysis connected with specific projects, such as satellite experiments or ground-based telescopes, or of specialized techniques.