A Wideband Omnidirectional Metasurface Antenna Using Characteristic Mode Analysis

IF 3.7 2区 计算机科学 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Guirong Feng;Zixiang Wu;Yabo Lu;Jiaze Xu;Shanzhe Wang;Zhizhang Chen
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引用次数: 0

Abstract

A wideband omnidirectional metasurface antenna has been proposed. The characteristic mode analysis (CMA) was applied to explore the modal behaviors of the metasurface and guide the design. The proposed metasurface is designed based on a 5 × 5 square patched array, which is a hybrid metasurface incorporating square patches with 2 × 2 and 3 × 3 subarrays in a distributive arrangement, significantly improving the bandwidth and current distribution over a wide band. By properly adjusting the sizes of these elements, the bandwidth and gain are further improved. Based on the predicted excitation of the metasurface, a probe center-fed circular patch is introduced on the bottom layer, which not only excites the metasurface but also generates an additional mode to compensate the metasurface for attaining stable omnidirectional radiation. An antenna prototype was simulated, fabricated, and tested. The results show that the proposed antenna achieves a wide bandwidth of 70.1%, a peak gain ranging from 2 dBi to 6 dBi, and radiates a good omnidirectional pattern.
我们提出了一种宽带全向元面天线。应用特征模态分析(CMA)来探索元面的模态行为并指导设计。所提出的元面是基于 5 × 5 方形贴片阵列设计的,它是一种混合元面,将方形贴片与 2 × 2 和 3 × 3 子阵列以分布排列的方式结合在一起,从而显著改善了宽频带的带宽和电流分布。通过适当调整这些元件的尺寸,可进一步提高带宽和增益。根据预测的元面激励,在底层引入了探针中心馈电圆形贴片,它不仅能激励元面,还能产生额外的模式来补偿元面,从而获得稳定的全向辐射。对天线原型进行了仿真、制造和测试。结果表明,该天线的带宽达到 70.1%,峰值增益从 2 dBi 到 6 dBi 不等,并具有良好的全向辐射模式。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
CiteScore
8.00
自引率
9.50%
发文量
529
审稿时长
1.0 months
期刊介绍: IEEE Antennas and Wireless Propagation Letters (AWP Letters) is devoted to the rapid electronic publication of short manuscripts in the technical areas of Antennas and Wireless Propagation. These are areas of competence for the IEEE Antennas and Propagation Society (AP-S). AWPL aims to be one of the "fastest" journals among IEEE publications. This means that for papers that are eventually accepted, it is intended that an author may expect his or her paper to appear in IEEE Xplore, on average, around two months after submission.
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