Duplication of periodic micro-structure on the surface of a nickel substrate and its application in surface-enhanced laser-induced breakdown spectroscopy

IF 3.2 2区化学 Q1 SPECTROSCOPY

Spectrochimica Acta Part B: Atomic Spectroscopy Pub Date : 2025-02-06 DOI:10.1016/j.sab.2025.107139

Zenghui Wang, Yufeng Li, Yuqi Chen, Runhua Li

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Abstract

In order to improve the analytical performance of surface-enhanced laser-induced breakdown spectroscopy (SENLIBS) on the elemental analysis of liquid samples, a 20 μm cylindric rod periodic micro-structure with 20 μm rod diameter, 15 μm rod height and 40 μm periodic length was successfully duplicated on the surface of a nickel substrate using electroplating method. The presence of periodic micro-structure on nickel surface changes the interaction of the laser and substrate; thus, plasma with higher temperature and higher electron density can be generated. The atomic emissions of both analytes and substrates' elements can be significantly enhanced in SENLIBS analysis if compared with that of using a flat substrate without any micro-structures. Mn, Pb, and Cr in aqueous solution samples were quantitatively analyzed by SENLIBS using these surface micro-structured nickel substrates. The detection limit of Mn, Pb, and Cr reached to 107.9 ng/mL, 76.0 ng/mL and 70.5 ng/mL under current experimental condition, respectively. In comparison with that obtained in similar analysis using flat nickel substrates, 4.2–5.1 folds improvement factors on the analytical sensitivity were achieved. This approach demonstrates a cost-effective and convenient method for the substrate preparation and provides a more sensitive elemental analysis of liquid samples by SENLIBS.

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来源期刊

Spectrochimica Acta Part B: Atomic Spectroscopy 物理-光谱学

CiteScore

6.10

自引率

12.10%

发文量

173

审稿时长

81 days

期刊介绍： Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields: Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy; Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS). Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS). X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF). Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.