Ruicheng Feng , Hanzong Xu , Baocheng Zhou , Tao Chen , Haiyan Li , Hui Cao , Chunli Lei
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引用次数: 0
Abstract
The study investigated the effects of different tip radii and scratch depths of diamond conical indenter on the surface nano-scratching mechanism of single-crystal γ-TiAl alloys using Molecular Dynamics (MD) simulations. Effectively combining the scratching parameters with crystal orientation, the variation rules of temperature, mechanical response, atomic flow, subsurface damage, and surface morphology during the scratching process are revealed. The results demonstrate that increasing indenter tip radius and scratch depth lead to higher values of scratch force, temperature, and degree of subsurface damage. Moreover, the average coefficient of friction (COF) and removal rate of atomic wear increase with an increase in the ratio between scratch depth and indenter tip radius (d/r), also known as relative tool sharpness (RTS), a larger RTS facilitates generating more pile-up on both sides. In comparison, a smaller RTS concentrates chips at the indenter's tip. Furthermore, crystal orientation significantly influences the extent to which scratching parameters affect the matrix, specifically, the crystal orientation exhibits higher scratch sensitivity. Finally, the optical morphology of the scratch was obtained by scratch experiment and qualitatively compared with the simulation results. The research results provide valuable insights for the selection of machining parameters of γ-TiAl alloy at nano-scale.
期刊介绍:
Precision Engineering - Journal of the International Societies for Precision Engineering and Nanotechnology is devoted to the multidisciplinary study and practice of high accuracy engineering, metrology, and manufacturing. The journal takes an integrated approach to all subjects related to research, design, manufacture, performance validation, and application of high precision machines, instruments, and components, including fundamental and applied research and development in manufacturing processes, fabrication technology, and advanced measurement science. The scope includes precision-engineered systems and supporting metrology over the full range of length scales, from atom-based nanotechnology and advanced lithographic technology to large-scale systems, including optical and radio telescopes and macrometrology.