High efficiency fabrication of Si microlenses by applying in-situ laser and ultrasonic vibration hybrid diamond cutting

IF 3.5 2区 工程技术 Q2 ENGINEERING, MANUFACTURING
Jianguo Zhang, Xinhuan Li, Shanyi Ma, Yujiang Lu, Haoxia Tian, Junfeng Xiao, Jianfeng Xu
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引用次数: 0

Abstract

Microlens arrays are important component units of new optical systems with the advantageous of small unit size and high degree of integration. In this research, the efficient fabrication of microlens arrays on hard and brittle material of silicon is achieved by coupling high efficiency ultrasonic elliptical vibration trajectory with in-situ laser softening technology. Firstly, the generation mode and morphology characteristics of the microlens array are fitted by the numerical calculation. Moreover, the actual machining parameters are furtherly confirmed. Furthermore, the maximum critical depth of cut along each crystal direction of monocrystalline silicon is experimentally verified by grooving investigation for anisotropy. Finally, the high efficiency fabrication of the microlens array on silicon is carried out by applying the in-situ laser-vibration hybrid assisted diamond cutting system, where the experimental results matched well with the simulation results. This work provides a valuable method for fast fabrication of microstructure arrays on hard and brittle materials, which has broad application in precision engineering.
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来源期刊
CiteScore
7.40
自引率
5.60%
发文量
177
审稿时长
46 days
期刊介绍: Precision Engineering - Journal of the International Societies for Precision Engineering and Nanotechnology is devoted to the multidisciplinary study and practice of high accuracy engineering, metrology, and manufacturing. The journal takes an integrated approach to all subjects related to research, design, manufacture, performance validation, and application of high precision machines, instruments, and components, including fundamental and applied research and development in manufacturing processes, fabrication technology, and advanced measurement science. The scope includes precision-engineered systems and supporting metrology over the full range of length scales, from atom-based nanotechnology and advanced lithographic technology to large-scale systems, including optical and radio telescopes and macrometrology.
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