Super-Resolution Ptychography with Small Segmented Detectors.

IF 2.9 4区 工程技术 Q3 MATERIALS SCIENCE, MULTIDISCIPLINARY
Xiyue Zhang, Zhen Chen, Yu-Tsun Shao, Ariana Ray, Yi Jiang, David Muller
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引用次数: 0

Abstract

To overcome the spatial resolution limit set by aperture-limited diffraction in traditional scanning transmission electron microscopy, microscopists have developed ptychography enabled by iterative phase retrieval algorithms and high-dynamic-range pixel array detectors. Current detector designs are limited by the data rate off chip, so a high-pixel-count detector has a proportionally lower frame rate than the few-segment detectors used for differential phase contrast (DPC) imaging. This slower acquisition speed leads to heightened vulnerability to scan noise, drift, and potential sample damage. This creates opportunities for repurposing fast segmented detectors for ptychography by trading a reduction in reciprocal space pixels for an increase in real space pixels. Here, we explore a strategy of oversampling in real space and instead apply detector pixel upsampling during the reconstruction process. We demonstrate the viability of achieving super-resolution ptychography on thin objects using only 2 × 2 detector pixels, surpassing the resolution of integrated DPC (iDPC) imaging. With optimization using simulated datasets and experiments on MoTe2/WSe2 bilayer moiré superlattices, we achieved super-resolution ptychography reconstructions under rapid acquisition conditions (37.5 pA, 1 μs dwell time), yielding over 50% improvements in contrast and information limit compared to annular dark field and iDPC imaging on the same detectors.

小分段检测器的超分辨率平面摄影。
为了克服传统扫描透射电子显微镜中孔径限制衍射的空间分辨率限制,显微镜学家开发了基于迭代相位检索算法和高动态范围像素阵列探测器的平面摄影技术。目前的检测器设计受到芯片外数据速率的限制,因此高像素计数检测器的帧率比用于差分相对比(DPC)成像的少段检测器低。这种较慢的采集速度导致扫描噪声、漂移和潜在样品损坏的脆弱性增加。这为通过减少互易空间像素来增加实际空间像素,从而重新利用快速分割检测器用于平面摄影创造了机会。在这里,我们探索了一种在真实空间中过采样的策略,而不是在重建过程中应用检测器像素上采样。我们证明了仅使用2 × 2探测器像素在薄物体上实现超分辨率平面摄影的可行性,超过了集成DPC (iDPC)成像的分辨率。通过模拟数据集的优化和MoTe2/WSe2双层moirir超晶格的实验,我们在快速采集条件下(37.5 pA, 1 μs停留时间)实现了超分辨率的ptygraphy重建,与在相同探测器上的环形暗场和iDPC成像相比,对比度和信息限制提高了50%以上。
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来源期刊
Microscopy and Microanalysis
Microscopy and Microanalysis 工程技术-材料科学:综合
CiteScore
1.10
自引率
10.70%
发文量
1391
审稿时长
6 months
期刊介绍: Microscopy and Microanalysis publishes original research papers in the fields of microscopy, imaging, and compositional analysis. This distinguished international forum is intended for microscopists in both biology and materials science. The journal provides significant articles that describe new and existing techniques and instrumentation, as well as the applications of these to the imaging and analysis of microstructure. Microscopy and Microanalysis also includes review articles, letters to the editor, and book reviews.
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