Quantitative Determination of High-Frequency Voltage Attenuation in an Electric-Pulse-Excited Stroboscopic Transmission Electron Microscope.

IF 2.9 4区工程技术 Q3 MATERIALS SCIENCE, MULTIDISCIPLINARY

Microscopy and Microanalysis Pub Date : 2025-02-17 DOI:10.1093/mam/ozae132

Feng Zhu, Wanpeng Li, Man Chun Yeung, Yuxuan Zhang, Congcong Du, Bin Lin, Qi Wang, Xiaofeng Guo, Yu-Chun Hsueh, Fu-Rong Chen, Xiaoyan Zhong

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引用次数: 0

Abstract

High-frequency electric pulse signals are often applied to stimulate functional materials in devices. To investigate the relationship between materials structure and dynamic behavior under high-frequency electric excitation, the stroboscopic imaging mode is widely used in a transmission electron microscope (TEM). From a technical point of view, it is crucial to quantitatively determine high-frequency attenuation in an electric-pulse-excited stroboscopic TEM. Here, we propose the quantitative method to evaluate the voltage attenuation by using magnification variation of defocused bright-field transmission electron microscopy images in a stroboscopic mode when applying high-frequency electric pulse signals onto a model system of two opposite tungsten tips. The negative voltage excitation possesses higher high-frequency voltage attenuation than the positive voltage excitation due to the possible nonreciprocal transmission of the triangle waves within the circuit between the biasing sample holder and the arbitrary waveform generator. Our approach of high-frequency attenuation determination provides the experimental foundation for quantitative analysis on the dynamic evolution of materials structure and functionality under electric pulse stimuli.

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电脉冲激发频闪透射电子显微镜高频电压衰减的定量测定。

高频电脉冲信号常用于器件中功能材料的刺激。为了研究高频电激励下材料结构与动态行为之间的关系，频闪成像模式被广泛应用于透射电子显微镜（TEM）中。从技术的角度来看，定量确定电脉冲激发频闪透射电镜中的高频衰减是至关重要的。在此，我们提出了一种定量的方法来评估电压衰减，即在频闪模式下使用高频电脉冲信号对两个相对钨尖的模型系统施加高频电脉冲信号时，利用离焦的明场透射电子显微镜图像的放大变化。负电压激励比正电压激励具有更高的高频电压衰减，因为在偏置样品保持器和任意波形发生器之间的电路中，三角波可能非互反传输。我们的高频衰减测定方法为定量分析电脉冲刺激下材料结构和功能的动态演变提供了实验基础。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Microscopy and Microanalysis 工程技术-材料科学：综合

CiteScore

1.10

自引率

10.70%

发文量

1391

审稿时长

6 months

期刊介绍： Microscopy and Microanalysis publishes original research papers in the fields of microscopy, imaging, and compositional analysis. This distinguished international forum is intended for microscopists in both biology and materials science. The journal provides significant articles that describe new and existing techniques and instrumentation, as well as the applications of these to the imaging and analysis of microstructure. Microscopy and Microanalysis also includes review articles, letters to the editor, and book reviews.