Hangfang Qiu , Qibin Chen , Lili He , Baiqi Zheng , Jinghu Li , Zhicong Luo
{"title":"A CMOS voltage reference with low temperature coefficient","authors":"Hangfang Qiu , Qibin Chen , Lili He , Baiqi Zheng , Jinghu Li , Zhicong Luo","doi":"10.1016/j.aeue.2024.155649","DOIUrl":null,"url":null,"abstract":"<div><div>This article introduces a CMOS voltage reference with low temperature coefficient (TC), high power supply rejection ratio (PSRR). A new self-biasing loop is proposed to generate a zero temperature characteristic current for the stacked diode-connected MOS transistors (SDMTs) to improve TC performance of reference voltage. Moreover, the drain induced barrier lowering (DIBL) effect compensation at the output stage absorbs power-related currents, improving linear sensitivity (LS). It employs voltage self-regulating technique to reduce the impact of power supply ripple on the output. The majority of MOSFETs operate in the sub-threshold region to minimize power consumption. Designed and simulated in a 65 nm CMOS process, the voltage reference output 418 mV with an average TC of 14.05 ppm/<span><math><mrow><msup><mrow></mrow><mrow><mo>∘</mo></mrow></msup><mi>C</mi></mrow></math></span> across a -40 °C to 125 °C temperature range. The proposed voltage reference LS is about 0.012 mV/V in the 0.85 - 1.32 V range. Significantly, the PSRR achieves -101 dB at 1 Hz and -62 dB at 1 MHz.</div></div>","PeriodicalId":50844,"journal":{"name":"Aeu-International Journal of Electronics and Communications","volume":"190 ","pages":"Article 155649"},"PeriodicalIF":3.0000,"publicationDate":"2025-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Aeu-International Journal of Electronics and Communications","FirstCategoryId":"94","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S1434841124005351","RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
This article introduces a CMOS voltage reference with low temperature coefficient (TC), high power supply rejection ratio (PSRR). A new self-biasing loop is proposed to generate a zero temperature characteristic current for the stacked diode-connected MOS transistors (SDMTs) to improve TC performance of reference voltage. Moreover, the drain induced barrier lowering (DIBL) effect compensation at the output stage absorbs power-related currents, improving linear sensitivity (LS). It employs voltage self-regulating technique to reduce the impact of power supply ripple on the output. The majority of MOSFETs operate in the sub-threshold region to minimize power consumption. Designed and simulated in a 65 nm CMOS process, the voltage reference output 418 mV with an average TC of 14.05 ppm/ across a -40 °C to 125 °C temperature range. The proposed voltage reference LS is about 0.012 mV/V in the 0.85 - 1.32 V range. Significantly, the PSRR achieves -101 dB at 1 Hz and -62 dB at 1 MHz.
期刊介绍:
AEÜ is an international scientific journal which publishes both original works and invited tutorials. The journal''s scope covers all aspects of theory and design of circuits, systems and devices for electronics, signal processing, and communication, including:
signal and system theory, digital signal processing
network theory and circuit design
information theory, communication theory and techniques, modulation, source and channel coding
switching theory and techniques, communication protocols
optical communications
microwave theory and techniques, radar, sonar
antennas, wave propagation
AEÜ publishes full papers and letters with very short turn around time but a high standard review process. Review cycles are typically finished within twelve weeks by application of modern electronic communication facilities.