Chung Won Lee , Seung Ju Kim , Han-Kyun Shin , Young-Jun Cho , Changhyeon Yoo , Sang Sub Han , Hyo-Jong Lee , Jung Han Kim , Yeonwoong Jung
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引用次数: 0
Abstract
The inherent limitations of von Neumann computing associated with its inefficient parallel-processing of massive data become increasingly pronounced in state-of-the-art digital device technologies. Artificial synapses of the human brain-inspired neuromorphic computing are emerging as a viable solution, which demands to explore unconventional materials responsive to a variety of electrical and/or optical stimuli. Herein, we report that solution-processed titanium carbide MXene (Ti3C2Tx) exhibits essential characteristics for optoelectronic synapses-based neuromorphic computing. Specifically, it presents optically-triggered synaptic plasticity with memory effects in a broad spectral range, as well as accompanying a large degree of mechanical deformability. By leveraging the optoelectronics-mechanics coupling, we demonstrate that MXene-based devices can simulate vital functionalities demanded in artificial neural networks (ANNs) such as associative learning behaviors and high-accuracy pattern recognition. Furthermore, the operational principle of the MXene optoelectronic synapses is unveiled in the context of the charge trapping/de-trapping mechanism enabled by its processing-introduced bandgap opening.
期刊介绍:
Nano Today is a journal dedicated to publishing influential and innovative work in the field of nanoscience and technology. It covers a wide range of subject areas including biomaterials, materials chemistry, materials science, chemistry, bioengineering, biochemistry, genetics and molecular biology, engineering, and nanotechnology. The journal considers articles that inform readers about the latest research, breakthroughs, and topical issues in these fields. It provides comprehensive coverage through a mixture of peer-reviewed articles, research news, and information on key developments. Nano Today is abstracted and indexed in Science Citation Index, Ei Compendex, Embase, Scopus, and INSPEC.