Yuanxin Li , Jianwei Zhang , Yunlong Zhang , Minghao Zhao , Chunsheng Lu , Ming Liu
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引用次数: 0
Abstract
Scratch testing is widely used for its convenience and promise but lacks analytical or semi-analytical solutions for determining the mechanical properties of materials. In this paper, by investigating the scratch-induced strain field, we propose a semi-analytical solution for the forward prediction of scratch responses and inverse characterization of plastic parameters of metallic materials. The solution is verified through finite element simulation and experimental data from eight different metallic materials. The results indicate that the method is precise, with an average error of 5.25% in the forward prediction of scratch forces and 7.48% in the inverse characterization of plastic parameters. This work provides a solid theoretical foundation for using scratch tests to assess material plasticity.
期刊介绍:
The International Journal of Solids and Structures has as its objective the publication and dissemination of original research in Mechanics of Solids and Structures as a field of Applied Science and Engineering. It fosters thus the exchange of ideas among workers in different parts of the world and also among workers who emphasize different aspects of the foundations and applications of the field.
Standing as it does at the cross-roads of Materials Science, Life Sciences, Mathematics, Physics and Engineering Design, the Mechanics of Solids and Structures is experiencing considerable growth as a result of recent technological advances. The Journal, by providing an international medium of communication, is encouraging this growth and is encompassing all aspects of the field from the more classical problems of structural analysis to mechanics of solids continually interacting with other media and including fracture, flow, wave propagation, heat transfer, thermal effects in solids, optimum design methods, model analysis, structural topology and numerical techniques. Interest extends to both inorganic and organic solids and structures.