X-ray photoelectron diffraction as one efficient tool for surface structure determination of corrugated 2D materials

Abstract

This brief review discusses the application of X-ray photoelectron diffraction (XPD) as an effective experimental tool for determining the surface structure of two-dimensional (2D) corrugated materials, such as graphene and hexagonal boron nitride. XPD stands out for its ability to provide precise atomic positions, interlayer distances, bond lengths, and bond angles. Such detailed experimental data are essential for refining theoretical models and complement the findings obtained through other techniques, like scanning probe microscopy (SPM). This brief review includes examples of surface structure studies on sp${}^2$-hybridized corrugated monolayers, such as graphene on Ir(111), Fe-intercalated graphene on Ir(111), $h$BN on Rh(111), and graphene on SiC(0001). XPD has uncovered significant structural details, such as corrugation amplitude and adsorption distances to the substrate, contributing to an enhanced understanding of the electronic, mechanical, optical, magnetic, and physicochemical properties of 2D materials.