A simulation optimization method for Verilog-AMS IBIS model under overclocking

IF 2.2 3区 工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
Yafei Ning , Zirui Zhang , Yuan Dong , Ziqi Zhang , Yuhan Xia
{"title":"A simulation optimization method for Verilog-AMS IBIS model under overclocking","authors":"Yafei Ning ,&nbsp;Zirui Zhang ,&nbsp;Yuan Dong ,&nbsp;Ziqi Zhang ,&nbsp;Yuhan Xia","doi":"10.1016/j.vlsi.2025.102364","DOIUrl":null,"url":null,"abstract":"<div><div>The Input/Output Buffer Information Specification (IBIS) model has effectively described the electrical characteristics of circuit input and output ports while safeguarding intellectual property. This model focuses on the analysis of the analog behavior of digital integrated circuits, specifically focusing on the electrical characteristic of I/O buffers, by considering the voltage and current waveforms of the digital I/O signals. However, under overclocking conditions, the model experiences distortion and reduced accuracy due to decreased circuit stability. To address this limitation, we introduce an optimized model designed to resist simulation distortions in the IBIS model during overclocking. First, we defined the relevant variables based on the IBIS circuit and constructed a physical model framework. Next, we studied the monotonicity and sufficient conditions of the physical model, established the relationship between model output and variable parameters, and derived the corresponding IBIS mathematical relationship. Then, to address distortion under overclocking conditions, we adjusted the model variables by setting weighting coefficients tailored to different scenarios, ensuring the output values were closer to the baseline model and significantly enhancing the model's resilience against overclocking distortions. Extensive optimization experiments on three different devices confirm the general applicability of our proposed method, achieving optimization rates exceeding 90 % while maintaining high consistency with the TL baseline model. Notably, our approach improves overclocking simulation accuracy by 21.7 % with only a 2.2 % increase in CPU time, surpassing existing methods. This work addresses the IBIS model's overclocking distortion issue, significantly advancing the accuracy of circuit device simulations.</div></div>","PeriodicalId":54973,"journal":{"name":"Integration-The Vlsi Journal","volume":"102 ","pages":"Article 102364"},"PeriodicalIF":2.2000,"publicationDate":"2025-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Integration-The Vlsi Journal","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0167926025000215","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0

Abstract

The Input/Output Buffer Information Specification (IBIS) model has effectively described the electrical characteristics of circuit input and output ports while safeguarding intellectual property. This model focuses on the analysis of the analog behavior of digital integrated circuits, specifically focusing on the electrical characteristic of I/O buffers, by considering the voltage and current waveforms of the digital I/O signals. However, under overclocking conditions, the model experiences distortion and reduced accuracy due to decreased circuit stability. To address this limitation, we introduce an optimized model designed to resist simulation distortions in the IBIS model during overclocking. First, we defined the relevant variables based on the IBIS circuit and constructed a physical model framework. Next, we studied the monotonicity and sufficient conditions of the physical model, established the relationship between model output and variable parameters, and derived the corresponding IBIS mathematical relationship. Then, to address distortion under overclocking conditions, we adjusted the model variables by setting weighting coefficients tailored to different scenarios, ensuring the output values were closer to the baseline model and significantly enhancing the model's resilience against overclocking distortions. Extensive optimization experiments on three different devices confirm the general applicability of our proposed method, achieving optimization rates exceeding 90 % while maintaining high consistency with the TL baseline model. Notably, our approach improves overclocking simulation accuracy by 21.7 % with only a 2.2 % increase in CPU time, surpassing existing methods. This work addresses the IBIS model's overclocking distortion issue, significantly advancing the accuracy of circuit device simulations.
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来源期刊
Integration-The Vlsi Journal
Integration-The Vlsi Journal 工程技术-工程:电子与电气
CiteScore
3.80
自引率
5.30%
发文量
107
审稿时长
6 months
期刊介绍: Integration''s aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics: Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.
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