A 2.69-ppm/°C curvature-compensated BJT-based bandgap voltage reference

IF 2.2 3区 工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
Hamidreza Rashidian , Iman Soltani , Mohammad Maghsoudi
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引用次数: 0

Abstract

This research presents a BJT-based bandgap reference circuit, aiming to minimize the temperature coefficient and active area for low-power and compact applications. A curvature compensation technique is introduced to enhance the temperature coefficient and extend the operational temperature range. The proposed BGR, simulated using a 0.18-μm CMOS process, demonstrates a simulated reference voltage of 0.269 V and TC of 2.69 ppm/°C for the reference output across a wide temperature range of −50 °C–150 °C. Furthermore, the proposed circuit occupies a compact silicon area of 0.0054 mm2, shows a line regulation 0.46 %/V, and consumes a power of 22.07 μW at 25 °C. The proposed bandgap reference circuit well-suited for providing reference voltages in various integrated circuits, particularly in high-precision low-power applications.
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来源期刊
Integration-The Vlsi Journal
Integration-The Vlsi Journal 工程技术-工程:电子与电气
CiteScore
3.80
自引率
5.30%
发文量
107
审稿时长
6 months
期刊介绍: Integration''s aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics: Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.
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