A 10 Gb/s PAM4 receiver with reference-less half-rate Bang-Bang CDR in 180-nm CMOS

IF 1.9 3区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Jiaxin Liu , Yinhang Zhang , Chao Yin , Xi Yang , Yongzheng Zhan
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引用次数: 0

Abstract

This paper discusses a 10 Gb/s PAM4 wireline receiver that employs bandwidth compensation in analog front-end (AFE), high performance half rate data recovery circuit and clock recovery circuit without reference clock. The combination of continuous-time linear equalizer (CTLE) with peaking inductance and transimpedance amplifier (TIA) based on inverter improves the bandwidth and gain of AFE. Level shifter and limiting amplifier (LA) achieve the conversion of multi-level signals to thermometer codes and reduces the accuracy or adaptive requirements of comparator threshold voltage. The jitter of clock recovery circuit is effectively reduced by the half rate Bang-Bang phase detector (BBPD), and quadrature LC-voltage-controlled oscillator (LC-VCO) guarantees the low jitter of recovered clock. The post-simulation results show that the receiver can provide as much as 6.086 dB equalization. The core of the receiver occupies 1.25 × 0.84 mm2 area and consumes 195.42 mW power at the supply voltage of 1.8 V. The horizontal opening degree of recovered 2.5 Gb/s data reaches 0.8 UI and the jitter of recovered 2.5 Gb/s clock is 11.76 ps.
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来源期刊
Microelectronics Journal
Microelectronics Journal 工程技术-工程:电子与电气
CiteScore
4.00
自引率
27.30%
发文量
222
审稿时长
43 days
期刊介绍: Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems. The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc. Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.
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