Effect of the compensation probe position on the value of the measured potential of a conducting object with constant charge

Abstract

The article presents how the position of a compensation probe affects the measured potential of a conductive object with constant charge. This influence is usually difficult to predict and requires a numerical analysis. Simulations have been carried out to show to what extent a compensation probe can affect the potential of an object. It was shown that the location of the probe can noticeably affect the value of the measured potential of a conducting object with constant charge Q. Article also introduces the concept of an auxiliary surface S_pu that can assist in identifying the optimal placement of the probe.