Accurate and Robust Wide-Range Luminescent Microthermometer Based on ALD-Encapsulated Ga2O3:Cr DBR Microcavities (Adv. Mater. Technol. 1/2025)

IF 6.4 3区材料科学 Q1 MATERIALS SCIENCE, MULTIDISCIPLINARY

Advanced Materials Technologies Pub Date : 2025-01-08 DOI:10.1002/admt.202570001

Manuel Alonso-Orts, Ruben J. T. Neelissen, Daniel Carrasco, Marco Schowalter, Andreas Rosenauer, Emilio Nogales, Bianchi Méndez, Martin Eickhoff

引用次数: 0

Abstract

Luminescence Thermometry

Atomic layer deposition (ALD) is a powerful technique for achieving smooth and robust distributed Bragg reflector (DBR) coatings on microwire ends. In article number 2400881, Manuel Alonso-Orts and co-workers create optical microcavities with ALD-coated, chromium-doped gallium oxide (Ga₂O₃:Cr) microwires and demonstrate their use for wide-range temperature sensors with high stability, precision and accuracy, monitoring the temperature-induced spectral shifts of the resonant peaks.

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来源期刊

Advanced Materials Technologies Materials Science-General Materials Science

CiteScore

10.20

自引率

4.40%

发文量

566

期刊介绍： Advanced Materials Technologies Advanced Materials Technologies is the new home for all technology-related materials applications research, with particular focus on advanced device design, fabrication and integration, as well as new technologies based on novel materials. It bridges the gap between fundamental laboratory research and industry.