Development and Efficiency Analysis of Dual Active Bridge Converter Employing SiC Devices Using TMS 320F280039

IF 1 4区工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC

Iet Circuits Devices & Systems Pub Date : 2025-02-03 DOI:10.1049/cds2/6336609

T. Deepti, K. Deepa, Albert Alexander Stonier, Geno Peter, A. Anoop, Vivekananda Ganji

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Abstract

The utilization of on-board chargers (OBCs) in electric vehicle (EV) has become increasing prevalent due to their configuration and cost-efficiency in the context of installation. Furthermore, the automobile industry is increasingly showing interest in bidirectional power flow because of the EV’s ability to provide energy back to the network. The paper presents an analytical method for designing the crucial elements of dual active bridge (DAB) with single-phase shift (SPS) modulation control. By comparing the estimated energy efficiency characteristics with measurements from a prototype 90-W single-phase DAB converter fitted with silicon carbide (SiC) MOSFETs, the robustness of this approach is exemplified and loss, and efficiency comparison analysis is carried out with conventional switching devices. Furthermore, this study presents a closed-loop voltage controller that effectively regulates the output voltage in the presence of significant variations in both the input line and load conditions. Finally, a comparison analysis is undertaken to evaluate important factors such as overall efficiency and settling time across different load circumstances. This analysis provides substantial perspectives toward the actual functionality of these systems through contrasts of simulation results with hardware-based results from the real world.

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来源期刊

Iet Circuits Devices & Systems 工程技术-工程：电子与电气

CiteScore

3.80

自引率

7.70%

发文量

审稿时长

3 months

期刊介绍： IET Circuits, Devices & Systems covers the following topics: Circuit theory and design, circuit analysis and simulation, computer aided design Filters (analogue and switched capacitor) Circuit implementations, cells and architectures for integration including VLSI Testability, fault tolerant design, minimisation of circuits and CAD for VLSI Novel or improved electronic devices for both traditional and emerging technologies including nanoelectronics and MEMs Device and process characterisation, device parameter extraction schemes Mathematics of circuits and systems theory Test and measurement techniques involving electronic circuits, circuits for industrial applications, sensors and transducers