{"title":"Design of a pulsed eddy current testing power supply combining constant amplitude and clamp voltage control","authors":"Wenguang Chen, Shuang Wen, Zhijian Liu, Liang Zheng","doi":"10.1007/s10470-025-02331-1","DOIUrl":null,"url":null,"abstract":"<div><p>Pulsed Eddy Current Testing (PECT) is a hotspot for non-destructive testing of metallic materials. As a key part of the system, the performance of the excitation source will directly affect the results. A new pulse power supply circuit is proposed to overcome the problems of long turn-off time, no constant current control, large volume, and low power of the excitation source in the existing PECT method for material defects. It uses a combination of linear regulated power supply and switched power supply to realize a compound circuit topology of constant current and constant voltage clamp. Then, the stability and rapidity of the excitation system are verified through simulation experiments and prototype demonstration. The amplitude of the pulsed power supply is adjustable within 20A, with an inaccuracy under 1%, and it is able to turn off at high speed with an edge fall time of nanoseconds. Finally, the prototype is used to simulate the detection of aluminum metal defects, the peak voltage of the detection coil can accurately identify different defect depths with high resolution. Its results show that the design method is feasible and has excellent performance.</p></div>","PeriodicalId":7827,"journal":{"name":"Analog Integrated Circuits and Signal Processing","volume":"122 2","pages":""},"PeriodicalIF":1.2000,"publicationDate":"2025-01-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Analog Integrated Circuits and Signal Processing","FirstCategoryId":"5","ListUrlMain":"https://link.springer.com/article/10.1007/s10470-025-02331-1","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0
Abstract
Pulsed Eddy Current Testing (PECT) is a hotspot for non-destructive testing of metallic materials. As a key part of the system, the performance of the excitation source will directly affect the results. A new pulse power supply circuit is proposed to overcome the problems of long turn-off time, no constant current control, large volume, and low power of the excitation source in the existing PECT method for material defects. It uses a combination of linear regulated power supply and switched power supply to realize a compound circuit topology of constant current and constant voltage clamp. Then, the stability and rapidity of the excitation system are verified through simulation experiments and prototype demonstration. The amplitude of the pulsed power supply is adjustable within 20A, with an inaccuracy under 1%, and it is able to turn off at high speed with an edge fall time of nanoseconds. Finally, the prototype is used to simulate the detection of aluminum metal defects, the peak voltage of the detection coil can accurately identify different defect depths with high resolution. Its results show that the design method is feasible and has excellent performance.
期刊介绍:
Analog Integrated Circuits and Signal Processing is an archival peer reviewed journal dedicated to the design and application of analog, radio frequency (RF), and mixed signal integrated circuits (ICs) as well as signal processing circuits and systems. It features both new research results and tutorial views and reflects the large volume of cutting-edge research activity in the worldwide field today.
A partial list of topics includes analog and mixed signal interface circuits and systems; analog and RFIC design; data converters; active-RC, switched-capacitor, and continuous-time integrated filters; mixed analog/digital VLSI systems; wireless radio transceivers; clock and data recovery circuits; and high speed optoelectronic circuits and systems.