Lead-free perovskite Cs2AgBiBr6/Cs3Bi2Br9 single-crystalline heterojunction X-ray detector with enhanced sensitivity and ultra-low detection limit

IF 6.8 2区 材料科学 Q1 MATERIALS SCIENCE, MULTIDISCIPLINARY
Hongjie Liu  (, ), Xue Sun  (, ), Jiaxin Liu  (, ), Xiang Li  (, ), Yunqiu Hua  (, ), Zhongjie Yue  (, ), Jian Song  (, ), Xilong Wang  (, ), Yujie Yang  (, ), Qianqian Lin  (, ), Zhongjun Zhai  (, ), Xutang Tao  (, ), Guodong Zhang  (, )
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引用次数: 0

Abstract

Lead-halide perovskite single crystal (SC) heterojunctions have attracted significant attention for X-ray detection owing to their unique combination of high sensitivity, resolution, stability and low detection limit. However, the toxicity of lead in those perovskite heterojunctions limits their practical applications. Herein, we report the construction of the first all-inorganic lead-free Cs2AgBiBr6/Cs3Bi2Br9 SC heterojunctions with an area of 20 × 20 mm2 via a facile liquid-phase epitaxial method through temperature-lowering crystallization. The epitaxial crystallization of the three-dimensional (3D) Cs2AgBiBr6 SC film on a 2D Cs3Bi2Br9 SC substrate requires a large driving force for transitioning from the Volmer–Weber mode to the layer-by-layer growth mode under a rapid cooling rate. The Cs2AgBiBr6/Cs3Bi2Br9 SC heterojunction detector achieves a high sensitivity of 1390 µC Gyair−1 cm−2 for 100 keV hard X-ray detection at room temperature, which is enhanced to 2075 µC Gyair−1 cm−2 at 75°C, demonstrating impressive high-temperature stability. Moreover, the detector achieves a detection limit of 37.48 nGyair s−1 and excellent stability for 90 days without any encapsulation. This work demonstrates the feasibility of using the epitaxial mechanism of perovskite formation on a high-surface-energy substrate for the controllable construction of a 3D/2D heterojunction that significantly enhances X-ray detection performance.

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来源期刊
Science China Materials
Science China Materials Materials Science-General Materials Science
CiteScore
11.40
自引率
7.40%
发文量
949
期刊介绍: Science China Materials (SCM) is a globally peer-reviewed journal that covers all facets of materials science. It is supervised by the Chinese Academy of Sciences and co-sponsored by the Chinese Academy of Sciences and the National Natural Science Foundation of China. The journal is jointly published monthly in both printed and electronic forms by Science China Press and Springer. The aim of SCM is to encourage communication of high-quality, innovative research results at the cutting-edge interface of materials science with chemistry, physics, biology, and engineering. It focuses on breakthroughs from around the world and aims to become a world-leading academic journal for materials science.
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