Fault Feature Assessment Method for High-Voltage Circuit Breakers Based on Explainable Image Recognition

IF 2.9 3区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Yaxiong Tan;Jiayi Gong;Shangding Li;Jian Li;Weigen Chen
{"title":"Fault Feature Assessment Method for High-Voltage Circuit Breakers Based on Explainable Image Recognition","authors":"Yaxiong Tan;Jiayi Gong;Shangding Li;Jian Li;Weigen Chen","doi":"10.1109/TDEI.2024.3487820","DOIUrl":null,"url":null,"abstract":"The current deep learning (DL) model for fault diagnosis of high-voltage circuit breakers (HVCBs) lacks explainability. It is difficult to further analyze the cause and mechanism of faults, which could provide little help for the maintenance and optimization design of HVCBs. To address this problem, a fault feature assessment method of HVCBs based on explainable image recognition is proposed to realize a quantitative analysis of faults. First, the vibration signals of HVCBs are preprocessed by continuous wavelet transform (CWT). The time-frequency diagrams of CWT are segmented by the travel curve to obtain the action sequence of the HVCB. Then, Shapley additive explanations (SHAPs) explain the deep residual network ResNet to obtain the feature importance distribution maps. Through the feature importance distribution map, accurate fault location and time traceability can be realized, and the frequency-domain features of the fault can be directly visualized from the distribution degree of the feature importance. The fault evaluation factor (FEF) is proposed to quantitatively study the time-frequency–amplitude comprehensive difference between the fault state and the normal state of the circuit breaker.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 1","pages":"92-101"},"PeriodicalIF":2.9000,"publicationDate":"2024-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Dielectrics and Electrical Insulation","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10737379/","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0

Abstract

The current deep learning (DL) model for fault diagnosis of high-voltage circuit breakers (HVCBs) lacks explainability. It is difficult to further analyze the cause and mechanism of faults, which could provide little help for the maintenance and optimization design of HVCBs. To address this problem, a fault feature assessment method of HVCBs based on explainable image recognition is proposed to realize a quantitative analysis of faults. First, the vibration signals of HVCBs are preprocessed by continuous wavelet transform (CWT). The time-frequency diagrams of CWT are segmented by the travel curve to obtain the action sequence of the HVCB. Then, Shapley additive explanations (SHAPs) explain the deep residual network ResNet to obtain the feature importance distribution maps. Through the feature importance distribution map, accurate fault location and time traceability can be realized, and the frequency-domain features of the fault can be directly visualized from the distribution degree of the feature importance. The fault evaluation factor (FEF) is proposed to quantitatively study the time-frequency–amplitude comprehensive difference between the fault state and the normal state of the circuit breaker.
求助全文
约1分钟内获得全文 求助全文
来源期刊
IEEE Transactions on Dielectrics and Electrical Insulation
IEEE Transactions on Dielectrics and Electrical Insulation 工程技术-工程:电子与电气
CiteScore
6.00
自引率
22.60%
发文量
309
审稿时长
5.2 months
期刊介绍: Topics that are concerned with dielectric phenomena and measurements, with development and characterization of gaseous, vacuum, liquid and solid electrical insulating materials and systems; and with utilization of these materials in circuits and systems under condition of use.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信