Focal-Length Measurement of Multifocal Metalens by Using Far-Field Imaging

IF 2.3 3区工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC

IEEE Photonics Technology Letters Pub Date : 2025-01-17 DOI:10.1109/LPT.2025.3531044

Ming Zhou;Dengyu Shan;Jiaheng Gong;Haiyang Huang;Wei Li

引用次数: 0

Abstract

This article used far-field light source to investigate the focal length of the short focal length, multifocal metalens. The feasibility of the scheme was analyzed by using imaging simulation. In addition, the relative error between far-field imaging method and collimated laser measurement was analyzed. The data results show that the relative error is 0.49%, as the point light source located 2000mm away, for ideal test lens with focal length of 10mm. An optical system composed of double lenses was constructed to measure the focal length of a metasurface with four focal points. The experimental results show that the system can determine the focal position within a step of 0.1mm.

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来源期刊

IEEE Photonics Technology Letters 工程技术-工程：电子与电气

CiteScore

5.00

自引率

3.80%

发文量

404

审稿时长

2.0 months

期刊介绍： IEEE Photonics Technology Letters addresses all aspects of the IEEE Photonics Society Constitutional Field of Interest with emphasis on photonic/lightwave components and applications, laser physics and systems and laser/electro-optics technology. Examples of subject areas for the above areas of concentration are integrated optic and optoelectronic devices, high-power laser arrays (e.g. diode, CO2), free electron lasers, solid, state lasers, laser materials'' interactions and femtosecond laser techniques. The letters journal publishes engineering, applied physics and physics oriented papers. Emphasis is on rapid publication of timely manuscripts. A goal is to provide a focal point of quality engineering-oriented papers in the electro-optics field not found in other rapid-publication journals.