Selected transition probabilities in singly ionized bismuth atoms

IF 3.2 2区 化学 Q1 SPECTROSCOPY
Dejan Dojić, Nikodin V. Nedić, Miloš Skočić, Srdjan Bukvić
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Abstract

This paper contains experimentally determined values for the spontaneous emission transition probabilities (Einstein's coefficient A) of 9 seleced transitions in singly ionized bismuth atoms (Bi II). Laser-Induced Plasma (LIP) was used as a source of the optical emission spectra. Due to LIP spatial inhomogeneity, the inverse Abel transform method was applied to lateral LIP profiles recorded in side-on geometry. The relative intensities of spectral lines were measured as the area under a spectral line profile curve fitted to the Voigt function. The Saha-Boltzmann plot of three consecutive ionization states from Bi spectra was constructed assuming Local Thermodynamic Equilibrium (LTE) in LIP and served for electron temperature estimation. The electron density was estimated based on the Stark width measurement of a well-investigated diagnostic He I 388.86 nm spectral line. The Saha-Boltzmann fit parameters were used for deducing the A values. The uncertainties for every value of A were obtained through the error propagation procedure of errors in measured quantities as well as the Monte Carlo method.

Abstract Image

单电离铋原子的选择跃迁概率
本文包含了单电离铋原子(Bi II)中9个选定跃迁的自发发射跃迁概率(爱因斯坦系数A)的实验测定值。激光诱导等离子体(LIP)作为光学发射光谱的来源。由于LIP的空间不均匀性,将反Abel变换方法应用于侧面几何记录的侧向LIP剖面。光谱线的相对强度用符合Voigt函数的光谱线轮廓曲线下的面积来测量。在LIP的局部热力学平衡(LTE)条件下,从Bi光谱中构造了三个连续电离态的Saha-Boltzmann图,用于估计电子温度。电子密度的估计是基于一个研究充分的诊断He I 388.86 nm谱线的Stark宽度测量。采用Saha-Boltzmann拟合参数推导A值。通过测量量误差的误差传播过程和蒙特卡罗方法,得到了各A值的不确定度。
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来源期刊
CiteScore
6.10
自引率
12.10%
发文量
173
审稿时长
81 days
期刊介绍: Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields: Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy; Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS). Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS). X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF). Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.
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