Aleksandra Šajić , Dragan Ranković , Miroslav Ristić , Milica Marković , Jovan Ciganović , Miroslav Kuzmanović
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引用次数: 0
Abstract
The present work studies the capability of a Laser-Induced Breakdown Spectroscopy (LIBS) system based on a Transversely Excited Atmospheric pressure (TEA) CO2 laser for quantitative analysis of soda-lime glass. Calibration curves of Cd, Co, Cr and Cu were constructed using the ratio of the analyte emission line intensity to the line intensity of the internal standard. Coefficients of determination were in the range from 0.969 to 0.983, depending on the element. The accuracy of LIBS results was confirmed by X-ray spectrometry (XRF). Limits of detection (LODs) for several elements (Cd, Co, Cr, Cu, Fe, Ti and Ca) were estimated (typical values in range of 13‐24 ppm were obtained). The Stark-broadening and two ionic lines intensity ratio were used to determine electron number density and excitation temperature. Profilometric measurements showed the low destructiveness typical for LIBS technique, without glass damage such as shattering and cracking.
期刊介绍:
Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields:
Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy;
Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS).
Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS).
X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF).
Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.