Wei Hu , Qizhong Zhang , Chenghu Dai , Chunyu Peng , Wenjuan Lu , Xiulong Wu
{"title":"Low-power 12T TFET-MOSFET hybrid SRAM bitcell and hybrid 8T SRAM array based on multiplexing strategy","authors":"Wei Hu , Qizhong Zhang , Chenghu Dai , Chunyu Peng , Wenjuan Lu , Xiulong Wu","doi":"10.1016/j.mejo.2025.106569","DOIUrl":null,"url":null,"abstract":"<div><div>Due to the limitation of MOSFET subthreshold swing, traditional MOSFET-based static random-access memory (SRAM) circuits are difficult to meet the design requirements of low-power integrated circuits. To address these issues, we proposed a half-select disturb-free 12T TFET-MOSFET hybrid SRAM bitcell. It can avoid the forward p-i-n current and effectively mitigate the effect of current degradation, which greatly reduces the static power consumption of the circuit and improves the performance of SRAM. Specifically, compared to 12T, the write delay of the hybrid bitcell decreased by approximately 13.994 % at 0.6 V. Meanwhile, a TFET-MOSFET hybrid 8T SRAM array is proposed by a multiplexing strategy to reduce the area consumption. The proposed <span><math><mrow><mn>4</mn><mo>×</mo><mn>4</mn></mrow></math></span> hybrid SRAM array is comparable to the 12T bitcell in terms of static noise margin (SNM), read/write speed, and static power consumption. These results indicate that the proposed TFET-MOSFET hybrid 8T SRAM array is a good choice for applications that require low power consumption and high stability.</div></div>","PeriodicalId":49818,"journal":{"name":"Microelectronics Journal","volume":"157 ","pages":"Article 106569"},"PeriodicalIF":1.9000,"publicationDate":"2025-01-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microelectronics Journal","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S1879239125000189","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Due to the limitation of MOSFET subthreshold swing, traditional MOSFET-based static random-access memory (SRAM) circuits are difficult to meet the design requirements of low-power integrated circuits. To address these issues, we proposed a half-select disturb-free 12T TFET-MOSFET hybrid SRAM bitcell. It can avoid the forward p-i-n current and effectively mitigate the effect of current degradation, which greatly reduces the static power consumption of the circuit and improves the performance of SRAM. Specifically, compared to 12T, the write delay of the hybrid bitcell decreased by approximately 13.994 % at 0.6 V. Meanwhile, a TFET-MOSFET hybrid 8T SRAM array is proposed by a multiplexing strategy to reduce the area consumption. The proposed hybrid SRAM array is comparable to the 12T bitcell in terms of static noise margin (SNM), read/write speed, and static power consumption. These results indicate that the proposed TFET-MOSFET hybrid 8T SRAM array is a good choice for applications that require low power consumption and high stability.
期刊介绍:
Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems.
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