Boualem Berkani , Abdelhalim Kahoul , Jorge Miguel Sampaio , Salim Daoudi , José Pires Marques , Fernando Parente , Assala Hamidani , Stephen Croft , Andrea Favalli , Yazid Kasri , Amina Zidi , Kahina Amari
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引用次数: 0
Abstract
In this study, we use the relativistic multiconfiguration Dirac–Fock method (MCFD) to compute the probabilities of radiative and radiationless vacancy transfer from K- to L1-, L2-, and L3− subshells in 16S, 18Ar, 22Ti, 29Cu, 30Zn, 32Ge, 33As, 34Se, 36Kr, 40Zr, 48Cd, 50Sn, 52Te, 80Hg, 83Bi, and 86Rn atoms. Semi-theoretical calculations for elements within the atomic range of 18 ≤ Z ≤ 96 (18Ar to 96Cm) were also conducted, leveraging available data on radiative and radiationless transitions from the scientific literature. The theoretical calculation results aligned well with the values calculated semi-theoretically and with other published works. However, some notable differences were identified.
期刊介绍:
Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields:
Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy;
Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS).
Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS).
X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF).
Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.