Relativistic and semi-theoretical calculations of K-shell to L-shell/subshell vacancy transfer probabilities

IF 3.2 2区 化学 Q1 SPECTROSCOPY
Boualem Berkani , Abdelhalim Kahoul , Jorge Miguel Sampaio , Salim Daoudi , José Pires Marques , Fernando Parente , Assala Hamidani , Stephen Croft , Andrea Favalli , Yazid Kasri , Amina Zidi , Kahina Amari
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Abstract

In this study, we use the relativistic multiconfiguration Dirac–Fock method (MCFD) to compute the probabilities of radiative and radiationless vacancy transfer from K- to L1-, L2-, and L3 subshells in 16S, 18Ar, 22Ti, 29Cu, 30Zn, 32Ge, 33As, 34Se, 36Kr, 40Zr, 48Cd, 50Sn, 52Te, 80Hg, 83Bi, and 86Rn atoms. Semi-theoretical calculations for elements within the atomic range of 18 ≤ Z ≤ 96 (18Ar to 96Cm) were also conducted, leveraging available data on radiative and radiationless transitions from the scientific literature. The theoretical calculation results aligned well with the values calculated semi-theoretically and with other published works. However, some notable differences were identified.

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来源期刊
CiteScore
6.10
自引率
12.10%
发文量
173
审稿时长
81 days
期刊介绍: Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields: Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy; Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS). Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS). X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF). Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.
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