Yucheng Hu, Gunnar Kusch, Damilola Adeleye, Susanne Siebentritt, Rachel Oliver
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引用次数: 0
Abstract
Multi-microscopy offers significant benefits to the understanding of complex materials behaviour by providing complementary information from different properties. However, some characterisations may strongly influence other measurements in the same workflow. To acquire reliable and valid datasets, optimising multi-microscopy procedure is necessary. In present work, we studied the influence of the measurement order on the quality of multi-microscopy datasets. Multi-microscopy incorporating tunnelling current AFM (TUNA), electron backscatter diffraction (EBSD), and cathodoluminescence (CL) on a polycrystalline solar cell absorber, Cu(In,Ga)S2 (CIGS), is used as an example. The investigation revealed potential characterisation-induced contaminations, such as surface oxidation and hydrocarbon layer coating, of the sample surface. Their subsequent influence on the measurement results of following correlation techniques was examined. To optimise the dataset quality, multi-microscopy should be carried out in TUNA-EBSD-CL order, from the most to the least surface sensitive techniques. With the optimised multi-microscopy measurement order on a CIGS absorber, we directly correlated the local changes in electrical and opto-electronic properties with the microstructure of grain boundaries (GBs). The described methodology may also provide insightful concepts for applying other AFM-SEM-based multi-microscopy on different semiconductor materials.
期刊介绍:
The Journal of Microscopy is the oldest journal dedicated to the science of microscopy and the only peer-reviewed publication of the Royal Microscopical Society. It publishes papers that report on the very latest developments in microscopy such as advances in microscopy techniques or novel areas of application. The Journal does not seek to publish routine applications of microscopy or specimen preparation even though the submission may otherwise have a high scientific merit.
The scope covers research in the physical and biological sciences and covers imaging methods using light, electrons, X-rays and other radiations as well as atomic force and near field techniques. Interdisciplinary research is welcome. Papers pertaining to microscopy are also welcomed on optical theory, spectroscopy, novel specimen preparation and manipulation methods and image recording, processing and analysis including dynamic analysis of living specimens.
Publication types include full papers, hot topic fast tracked communications and review articles. Authors considering submitting a review article should contact the editorial office first.