Qingxiang Niu, Yongsheng Hong, Hui Jin, Tao Tao, Feifan Xu, Ting Zhi, Rongrong Dou, Zili Xie, Zhe Zhuang, Yu Yan, Wenjuan Chen, Cheng Qu, Wengang Bi, Bin Liu
{"title":"Rapid modulation bandwidth test system of micro-LED based on photon excitation.","authors":"Qingxiang Niu, Yongsheng Hong, Hui Jin, Tao Tao, Feifan Xu, Ting Zhi, Rongrong Dou, Zili Xie, Zhe Zhuang, Yu Yan, Wenjuan Chen, Cheng Qu, Wengang Bi, Bin Liu","doi":"10.1364/OL.547276","DOIUrl":null,"url":null,"abstract":"<p><p>Modulation bandwidth is essential for micro-LED in visible light communication systems. The traditional electroluminescence-based bandwidth test system (EL-BW-Test) is time-consuming and inevitably causes irreversible damage. This paper introduces the design and construction of a novel, to the best of our knowledge, photon-excited bandwidth testing system (PL-BW-Test), capable of swiftly acquiring the bandwidth of LED epi-wafers and devices. Comparison and experimental results demonstrated that the LED bandwidth measurements obtained via PL-BW-Test exhibit consistency with those acquired through EL-BW-Test, particularly concerning the excitation intensity and quantum well structure. The newly invented system presents several advantages including easy operation, broad applicability, and non-destructiveness, offering an innovative approach to an efficient, non-contact modulation bandwidth measurement.</p>","PeriodicalId":19540,"journal":{"name":"Optics letters","volume":"50 3","pages":"816-819"},"PeriodicalIF":3.1000,"publicationDate":"2025-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optics letters","FirstCategoryId":"101","ListUrlMain":"https://doi.org/10.1364/OL.547276","RegionNum":2,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"OPTICS","Score":null,"Total":0}
引用次数: 0
Abstract
Modulation bandwidth is essential for micro-LED in visible light communication systems. The traditional electroluminescence-based bandwidth test system (EL-BW-Test) is time-consuming and inevitably causes irreversible damage. This paper introduces the design and construction of a novel, to the best of our knowledge, photon-excited bandwidth testing system (PL-BW-Test), capable of swiftly acquiring the bandwidth of LED epi-wafers and devices. Comparison and experimental results demonstrated that the LED bandwidth measurements obtained via PL-BW-Test exhibit consistency with those acquired through EL-BW-Test, particularly concerning the excitation intensity and quantum well structure. The newly invented system presents several advantages including easy operation, broad applicability, and non-destructiveness, offering an innovative approach to an efficient, non-contact modulation bandwidth measurement.
期刊介绍:
The Optical Society (OSA) publishes high-quality, peer-reviewed articles in its portfolio of journals, which serve the full breadth of the optics and photonics community.
Optics Letters offers rapid dissemination of new results in all areas of optics with short, original, peer-reviewed communications. Optics Letters covers the latest research in optical science, including optical measurements, optical components and devices, atmospheric optics, biomedical optics, Fourier optics, integrated optics, optical processing, optoelectronics, lasers, nonlinear optics, optical storage and holography, optical coherence, polarization, quantum electronics, ultrafast optical phenomena, photonic crystals, and fiber optics. Criteria used in determining acceptability of contributions include newsworthiness to a substantial part of the optics community and the effect of rapid publication on the research of others. This journal, published twice each month, is where readers look for the latest discoveries in optics.