{"title":"ETSpy: A HyperSpy extension package for electron tomography data processing and reconstruction","authors":"Andrew A. Herzing , Joshua A. Taillon","doi":"10.1016/j.micron.2024.103774","DOIUrl":null,"url":null,"abstract":"<div><div>Electron tomography is a powerful tool for the three-dimensional characterization of materials at the nano- and atomic-scales. A typical workflow for tomography involves several pre-processing steps that may include spatial binning, image registration, and tilt-axis alignment depending upon the nature of the acquired data. Here we describe the capabilities of a new, open-source software package named ETSpy that builds upon the widely used HyperSpy package. The basic usage of the software and some specific applications are presented.</div></div>","PeriodicalId":18501,"journal":{"name":"Micron","volume":"190 ","pages":"Article 103774"},"PeriodicalIF":2.5000,"publicationDate":"2024-12-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Micron","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0968432824001914","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"MICROSCOPY","Score":null,"Total":0}
引用次数: 0
Abstract
Electron tomography is a powerful tool for the three-dimensional characterization of materials at the nano- and atomic-scales. A typical workflow for tomography involves several pre-processing steps that may include spatial binning, image registration, and tilt-axis alignment depending upon the nature of the acquired data. Here we describe the capabilities of a new, open-source software package named ETSpy that builds upon the widely used HyperSpy package. The basic usage of the software and some specific applications are presented.
期刊介绍:
Micron is an interdisciplinary forum for all work that involves new applications of microscopy or where advanced microscopy plays a central role. The journal will publish on the design, methods, application, practice or theory of microscopy and microanalysis, including reports on optical, electron-beam, X-ray microtomography, and scanning-probe systems. It also aims at the regular publication of review papers, short communications, as well as thematic issues on contemporary developments in microscopy and microanalysis. The journal embraces original research in which microscopy has contributed significantly to knowledge in biology, life science, nanoscience and nanotechnology, materials science and engineering.