Improved Defect Sizing in Adhesive Joints Through Feature-Based Data Fusion

Abstract

The current study focuses on the examination of adhesive-bonded materials, comprising different type of flaws like brass inclusions and delamination, through the application of ultrasound and X-ray non-destructive testing (NDT) techniques. The findings from both ultrasound and X-ray inspection were used to extract unique features, contributing to a more comprehensive understanding of the distinct characteristics demonstrated by each method. Several distinct features like absolute time of flight difference, peak-to-peak amplitude, variation coefficient in time and frequency domain, mean value of amplitude in frequency domain, and absolute energy were extracted from ultrasound testing results. Similarly, features like maximum amplitude, features from accelerated segment test, dilation, watershed segmentation, wiener deconvolution, and morphological gradient extracted from X-ray data underwent fusion. Different fusion techniques were applied to combine these features into a unified data set. A quantitative evaluation was performed for the individual features and their corresponding fused features from the ultrasound and X-ray results. A systematic analysis was conducted to quantify the improvement in defect sizing within the individual features and fused features from both the X-ray and ultrasonic investigations. The minimum absolute error of 0.02 mm was achieved with average fusion of absolute energy at 2nd interface and X-ray dilate features. This research not only delves into the diverse capabilities of ultrasonic and X-ray NDT methods in identifying flaws but also emphasizes the synergistic advantages arising from the integration of their distinct features. The qualitative study of defect estimation using the proposed fusion methods demonstrate that the distinctive fusion approaches significantly highlight the complimentary benefits of ultrasound and X-ray non-destructive testing methods, resulting in a quantifiable improvement in probability of defect detection.