Using light to image millimeter wave based on stacked meta-MEMS chip

IF 20.6 Q1 OPTICS
Han Wang, Zhigang Wang, Cheng Gong, Xinyu Li, Tiansheng Cui, Huiqi Jiang, Minghui Deng, Bo Yan, Weiwei Liu
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Abstract

A stacked metamaterial MEMS (meta-MEMS) chip is proposed, which can perfectly absorb electromagnetic waves, convert them into mechanical energy, drive movement of the optical micro-reflectors array, and detect millimeter waves. It is equivalent to using visible light to image a millimeter wave. The meta-MEMS adopts the design of upper and lower chip separation and then stacking to achieve the “dielectric-resonant-air-ground” structure, reduce the thickness of the metamaterial and MEMS structures, and improve the performance of millimeter wave imaging. For verification, we designed and prepared a 94 GHz meta-MEMS focal plane array chip, in which the sum of the thickness of the metamaterial and MEMS structures is only 1/2500 wavelength, the pixel size is less than 1/3 wavelength, but the absorption rate is as high as 99.8%. Moreover, a light readout module was constructed to test the millimeter wave imaging performance. The results show that the response speed can reach 144 Hz and the lens-less imaging resolution is 1.5 mm.

Abstract Image

基于堆叠元mems芯片的光成像毫米波
提出了一种能完美吸收电磁波并将其转化为机械能、驱动光学微反射器阵列运动、探测毫米波的堆叠超材料MEMS (meta-MEMS)芯片。这相当于用可见光对毫米波成像。meta-MEMS采用上下芯片分离再堆叠的设计,实现“介电-谐振-空-地”结构,减少了超材料和MEMS结构的厚度,提高了毫米波成像性能。为了验证,我们设计并制备了一个94 GHz的meta-MEMS焦平面阵列芯片,其中超材料与MEMS结构的厚度之和仅为1/2500波长,像素尺寸小于1/3波长,但吸收率高达99.8%。此外,还构建了光读出模块来测试毫米波成像性能。结果表明,该系统的响应速度可达144hz,无透镜成像分辨率为1.5 mm。
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来源期刊
Light-Science & Applications
Light-Science & Applications 数理科学, 物理学I, 光学, 凝聚态物性 II :电子结构、电学、磁学和光学性质, 无机非金属材料, 无机非金属类光电信息与功能材料, 工程与材料, 信息科学, 光学和光电子学, 光学和光电子材料, 非线性光学与量子光学
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803
审稿时长
2.1 months
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