Kai Niu, Xueting Du, Wei Mi, Di Wang, Lin'an He, Liwei Zhou, Yan Zhu, Juan Wang, Xingcheng Zhang, Jinshi Zhao
{"title":"Fabrication and characterization of heteroepitaxial Zn2GeO4 films on sapphire via radio frequency magnetron sputtering","authors":"Kai Niu, Xueting Du, Wei Mi, Di Wang, Lin'an He, Liwei Zhou, Yan Zhu, Juan Wang, Xingcheng Zhang, Jinshi Zhao","doi":"10.1063/5.0244857","DOIUrl":null,"url":null,"abstract":"In this study, we explored the fabrication, structural characteristics, and optical properties of Zn2GeO4 thin films grown on c-cut Al2O3 substrates via radio frequency magnetron sputtering. The crystalline quality, surface morphology, and optical characteristics were comprehensively evaluated at various annealing temperatures, and the 700 °C-annealed film presented the best crystallization quality. XRD and TEM results revealed the microstructure of Zn2GeO4 film and confirmed that the epitaxial relationship is Zn2GeO4 (0006)//Al2O3 (0006) with Zn2GeO4 [11¯00]//Al2O3 [11¯00]. O 1s spectrum indicated the bandgap of the 700 °C-annealed film is 4.98 eV. UV-Vis-Near Infrared spectroscopy showed that the average transmittance reached approximately 85% in the visible region, and the optical bandgap of Zn2GeO4 film annealed at 700 °C was about 5.02 eV.","PeriodicalId":8094,"journal":{"name":"Applied Physics Letters","volume":"6 1","pages":""},"PeriodicalIF":3.6000,"publicationDate":"2025-01-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Applied Physics Letters","FirstCategoryId":"101","ListUrlMain":"https://doi.org/10.1063/5.0244857","RegionNum":2,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"PHYSICS, APPLIED","Score":null,"Total":0}
引用次数: 0
Abstract
In this study, we explored the fabrication, structural characteristics, and optical properties of Zn2GeO4 thin films grown on c-cut Al2O3 substrates via radio frequency magnetron sputtering. The crystalline quality, surface morphology, and optical characteristics were comprehensively evaluated at various annealing temperatures, and the 700 °C-annealed film presented the best crystallization quality. XRD and TEM results revealed the microstructure of Zn2GeO4 film and confirmed that the epitaxial relationship is Zn2GeO4 (0006)//Al2O3 (0006) with Zn2GeO4 [11¯00]//Al2O3 [11¯00]. O 1s spectrum indicated the bandgap of the 700 °C-annealed film is 4.98 eV. UV-Vis-Near Infrared spectroscopy showed that the average transmittance reached approximately 85% in the visible region, and the optical bandgap of Zn2GeO4 film annealed at 700 °C was about 5.02 eV.
期刊介绍:
Applied Physics Letters (APL) features concise, up-to-date reports on significant new findings in applied physics. Emphasizing rapid dissemination of key data and new physical insights, APL offers prompt publication of new experimental and theoretical papers reporting applications of physics phenomena to all branches of science, engineering, and modern technology.
In addition to regular articles, the journal also publishes invited Fast Track, Perspectives, and in-depth Editorials which report on cutting-edge areas in applied physics.
APL Perspectives are forward-looking invited letters which highlight recent developments or discoveries. Emphasis is placed on very recent developments, potentially disruptive technologies, open questions and possible solutions. They also include a mini-roadmap detailing where the community should direct efforts in order for the phenomena to be viable for application and the challenges associated with meeting that performance threshold. Perspectives are characterized by personal viewpoints and opinions of recognized experts in the field.
Fast Track articles are invited original research articles that report results that are particularly novel and important or provide a significant advancement in an emerging field. Because of the urgency and scientific importance of the work, the peer review process is accelerated. If, during the review process, it becomes apparent that the paper does not meet the Fast Track criterion, it is returned to a normal track.