Approaching Charge Compensation Limit for Promoting Magnetoresistance in 2D Nonlayered MoO2 via Surface Hydrogen Passivation

IF 19 1区 材料科学 Q1 CHEMISTRY, MULTIDISCIPLINARY
Huanzhi Chen, Zongkui Tian, Xilong Zhou, Xiulian Fan, Zian Li, Cheng Li, Chenyang Niu, Wenlong Chu, Yuqi Zhou, Liqi He, Yumeng Yang, Zheng Peng, Yu Zhou
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Abstract

Large non-saturated magnetoresistances of semimetals are dominated by charge compensation due to their unique electronic structure. However, the dramatic magnetoresistance deteriorations are often observed in low-dimensional system resulting from high-density surface defects, where the suppression of charge scattering or concentration unbalance with highly maintained magnetoresistance is still challenging. Herein, a hydrogen annealing strategy is developed for surface defects passivation of 2D MoO2 nanoflakes. Systematical characterization for H-MoO2 nanoflakes reveals the formation of hydrogen chemical bonds that reduce surface defect density and slightly change Fermi level with unchanged bulk structures. An obviously enhanced magnetoresistance of 9.2% is demonstrated for H-MoO2 nanoflakes compared to Ar-MoO2 of 3.9% at 10 K and 9 T. The analysis of the nonlinearity Hall resistivity unravels the concentration of electrons and holes in H-MoO2 approaches a more balanced equilibrium, which is attributed to surface defects passivation resulting in the suppression of self-doping effects for enhanced magnetoresistance rather than the reduced charge scattering with slightly enhanced carrier mobility. The research not only provides a universal surface passivation strategy on 2D nonlayered semimetals for approaching the charge compensation limit with the preserved magnetoresistance but also underscores the significance of surface passivation in tuning electronic structures of 2D nonlayered materials.

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通过表面氢钝化提高二维非层状MoO2磁阻的电荷补偿极限逼近
由于半金属具有独特的电子结构,其较大的非饱和磁电阻主要由电荷补偿控制。然而,在低维系统中,由于高密度表面缺陷导致的磁电阻急剧恶化是经常观察到的,在这种情况下,用高度维持的磁电阻来抑制电荷散射或浓度不平衡仍然是一个挑战。本文提出了一种用于二维MoO2纳米片表面缺陷钝化的氢退火策略。对H-MoO2纳米薄片的系统表征表明,在体积结构不变的情况下,氢键的形成降低了表面缺陷密度,略微改变了费米能级。在10 K和9 t条件下,H-MoO2纳米片的磁电阻率明显提高了9.2%,而Ar-MoO2的磁电阻率仅为3.9%。对非线性霍尔电阻率的分析揭示了H-MoO2中电子和空穴的浓度趋于更平衡,这是由于表面缺陷钝化抑制了磁电阻增强的自掺杂效应,而不是由于载流子迁移率的轻微增强而降低了电荷散射。该研究不仅为二维非层状半金属在保持磁阻的情况下接近电荷补偿极限提供了一种通用的表面钝化策略,而且强调了表面钝化在二维非层状材料电子结构调谐中的重要意义。
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来源期刊
Advanced Functional Materials
Advanced Functional Materials 工程技术-材料科学:综合
CiteScore
29.50
自引率
4.20%
发文量
2086
审稿时长
2.1 months
期刊介绍: Firmly established as a top-tier materials science journal, Advanced Functional Materials reports breakthrough research in all aspects of materials science, including nanotechnology, chemistry, physics, and biology every week. Advanced Functional Materials is known for its rapid and fair peer review, quality content, and high impact, making it the first choice of the international materials science community.
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