{"title":"The Effect of Fe and Co doping on the Physical Properties of CdO Films Deposited by Ultrasonic Spray Pyrolysis","authors":"Barbaros Demirselcuk, İbrahim Güneş, Emrah Sarıca, Esra Kuş, Ayşe Küçükarslan, Vildan Bilgin","doi":"10.1007/s10854-024-14128-5","DOIUrl":null,"url":null,"abstract":"<div><p>In this study, Cadmium Oxide (CdO) semiconductor films with different iron (Fe) and cobalt (Co) concentrations have been produced at 350 °C substrate temperature on the glass substrates by the ultrasonic spray pyrolysis method. In the first part of this study, the Fe element was doped in different ratios (2, 4, 6%) to CdO films, and the films were characterized. At the end of this stage, the optimum Fe doping ratio was determined for CdO films. In the second step, CdO films were dually doped with Fe + Co. The electrical resistivities of CdO:Fe films were determined using a four-probe technique to measure their conductivities, carrier concentrations, mobilities, and electrical conductivity types through Hall measurements. The produced films showed n-type electrical conductivity. It was determined that with increasing doping ratios, the electrical resistivity generally increased, and the films exhibited n-type conductivity. The XRD patterns revealed that the crystal structures of the films were polycrystalline and cubic in structure. The lections of (111), (200), (220), (311), and (222) planes were observed in the XRD patterns. Upon examination of the SEM images, it was observed that the films had nearly homogeneous surfaces and good adhesion to the substrate. By utilizing the fundamental absorption spectra of the films, it was determined that they exhibited direct bandgap transitions, and the bandgap energy values ranged from 2.34 to 2.65 eV. In the structural analysis, all films were found to have a polycrystalline structure and cubic CdO crystal system. When the SEM images of CdO:(Fe + Co) films were examined, it was observed that the films had almost homogeneous surfaces. Based on all these analyses, it was concluded that the doping elements Fe and Co significantly influenced the physical properties of CdO thin films.</p></div>","PeriodicalId":646,"journal":{"name":"Journal of Materials Science: Materials in Electronics","volume":"36 2","pages":""},"PeriodicalIF":2.8000,"publicationDate":"2025-01-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Materials Science: Materials in Electronics","FirstCategoryId":"5","ListUrlMain":"https://link.springer.com/article/10.1007/s10854-024-14128-5","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
In this study, Cadmium Oxide (CdO) semiconductor films with different iron (Fe) and cobalt (Co) concentrations have been produced at 350 °C substrate temperature on the glass substrates by the ultrasonic spray pyrolysis method. In the first part of this study, the Fe element was doped in different ratios (2, 4, 6%) to CdO films, and the films were characterized. At the end of this stage, the optimum Fe doping ratio was determined for CdO films. In the second step, CdO films were dually doped with Fe + Co. The electrical resistivities of CdO:Fe films were determined using a four-probe technique to measure their conductivities, carrier concentrations, mobilities, and electrical conductivity types through Hall measurements. The produced films showed n-type electrical conductivity. It was determined that with increasing doping ratios, the electrical resistivity generally increased, and the films exhibited n-type conductivity. The XRD patterns revealed that the crystal structures of the films were polycrystalline and cubic in structure. The lections of (111), (200), (220), (311), and (222) planes were observed in the XRD patterns. Upon examination of the SEM images, it was observed that the films had nearly homogeneous surfaces and good adhesion to the substrate. By utilizing the fundamental absorption spectra of the films, it was determined that they exhibited direct bandgap transitions, and the bandgap energy values ranged from 2.34 to 2.65 eV. In the structural analysis, all films were found to have a polycrystalline structure and cubic CdO crystal system. When the SEM images of CdO:(Fe + Co) films were examined, it was observed that the films had almost homogeneous surfaces. Based on all these analyses, it was concluded that the doping elements Fe and Co significantly influenced the physical properties of CdO thin films.
期刊介绍:
The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.