High-Bandwidth Chiplet Interconnects for Advanced Packaging Technologies in AI/ML Applications: Challenges and Solutions

Shenggao Li;Mu-Shan Lin;Wei-Chih Chen;Chien-Chun Tsai
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Abstract

The demand for chiplet integration using 2.5D and 3D advanced packaging technologies has surged, driven by the exponential growth in computing performance required by artificial intelligence and machine learning (AI/ML). This article reviews these advanced packaging technologies and emphasizes critical design considerations for high-bandwidth chiplet interconnects, which are vital for efficient integration. We address challenges related to bandwidth density, energy efficiency, electromigration, power integrity, and signal integrity. To avoid power overhead, the chiplet interconnect architecture is designed to be as simple as possible, employing a parallel data bus with forwarded clocks. However, achieving highyield manufacturing and robust performance still necessitates significant efforts in design and technology co-optimization. Despite these challenges, the semiconductor industry is poised for continued growth and innovation, driven by the possibilities unlocked by a robust chiplet ecosystem and novel 3D-IC design methodologies.
AI/ML应用中先进封装技术的高带宽芯片互连:挑战和解决方案
由于人工智能和机器学习(AI/ML)所需的计算性能呈指数级增长,使用2.5D和3D先进封装技术的芯片集成需求激增。本文回顾了这些先进的封装技术,并强调了高带宽芯片互连的关键设计考虑因素,这对高效集成至关重要。我们致力于解决带宽密度、能源效率、电迁移、功率完整性和信号完整性方面的挑战。为了避免功率开销,芯片互连架构设计得尽可能简单,采用具有转发时钟的并行数据总线。然而,实现高产量制造和强大的性能仍然需要在设计和技术协同优化方面做出重大努力。尽管存在这些挑战,但在强大的芯片生态系统和新颖的3D-IC设计方法所释放的可能性的推动下,半导体行业仍将持续增长和创新。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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