A 59.6fsrms Jitter Sub-Sampling PLL With Foreground Open-Loop Gain Calibration

IF 4 2区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Yu-Chi Yen;Shen-Iuan Liu
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Abstract

A sub-sampling phase-locked loop (SSPLL) with foreground open-loop gain calibration is presented. By digitally adjusting the transconductance cell, the open-loop gain of the SSPLL is calibrated. This SSPLL is fabricated in 40 nm CMOS technology. Its active area is $0.167~{\mathrm { mm}}^{2}$ and the power consumption is 14.08mW at 6.4 GHz for a supply of 1V. The root-mean-square (RMS) jitter is 59.6fs while the phase noise is integrated with the offset frequency from 1 kHz to 100MHz. The calculated figure of merit is −253dB. With the calibration, the maximal deviation of the loop bandwidth is reduced from −41.5% to −7.3% for the supply voltage of 0.9V~1.1V. The maximal deviation of the RMS jitter is reduced from 23.6% to 4.7%. For five chips, the maximal deviation of the loop bandwidth is reduced from −34.9% to 4% with calibration. And the maximal deviation of the RMS jitter is reduced from 10.9% to −3.4%.
前置开环增益校准的59.6fsrms抖动子采样锁相环
提出了一种具有前景开环增益校准的子采样锁相环(SSPLL)。通过数字调节跨导单元,对SSPLL的开环增益进行了校准。该SSPLL采用40纳米CMOS技术制造。其有效面积为$0.167~{\ mathm {mm}}^{2}$,功耗为14.08mW, 6.4 GHz,电源电压为1V。均方根抖动(RMS)为59.6fs,相位噪声与1 kHz至100MHz的偏移频率相结合。计算得到的优值为−253dB。校正后,在0.9V~1.1V电压范围内,环路带宽的最大偏差由- 41.5%减小到- 7.3%。RMS抖动的最大偏差由23.6%减小到4.7%。对于5个芯片,校正后环路带宽的最大偏差从- 34.9%减小到4%。RMS抖动的最大偏差由10.9%减小到- 3.4%。
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来源期刊
IEEE Transactions on Circuits and Systems II: Express Briefs
IEEE Transactions on Circuits and Systems II: Express Briefs 工程技术-工程:电子与电气
CiteScore
7.90
自引率
20.50%
发文量
883
审稿时长
3.0 months
期刊介绍: TCAS II publishes brief papers in the field specified by the theory, analysis, design, and practical implementations of circuits, and the application of circuit techniques to systems and to signal processing. Included is the whole spectrum from basic scientific theory to industrial applications. The field of interest covered includes: Circuits: Analog, Digital and Mixed Signal Circuits and Systems Nonlinear Circuits and Systems, Integrated Sensors, MEMS and Systems on Chip, Nanoscale Circuits and Systems, Optoelectronic Circuits and Systems, Power Electronics and Systems Software for Analog-and-Logic Circuits and Systems Control aspects of Circuits and Systems.
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