SEM and TEM Image Analysis for Morphology and Phase Transition of CZTS, Sb2Se3 and Perovskite Thin Films under Thermal Stress

IF 2.2 4区工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC

Journal of Electronic Materials Pub Date : 2024-11-18 DOI:10.1007/s11664-024-11585-w

Ali Hajjiah, Nima E. Gorji

引用次数: 0

Abstract

This study utilizes an image processing method to analyse the grain size of perovskite, CZTS kesterite and antimony chalcogenide (Sb₂Se₃) thin films at various temperatures using SEM and TEM images. Empirical equations (exponential, Gaussian, power law) were derived from the data, revealing distinct temperature-dependent trends in grain size. Perovskite films exhibit a Gaussian trend, showing extreme sensitivity to temperature. CZTS films follow a double exponential function, with optimal grain size at 300°C. Sb₂Se₃ films adhere to a power law (~T⁶), with grain size rapidly increasing at higher temperatures. These temperature-dependent behaviours offer insights into optimizing fabrication processes and enhancing the efficiency of these materials in photovoltaic applications.

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本研究采用一种图像处理方法，利用 SEM 和 TEM 图像分析了不同温度下的包晶、CZTS kesterite 和锑瑀 (Sb2Se3) 薄膜的晶粒尺寸。根据数据推导出经验方程（指数、高斯、幂律），揭示了晶粒尺寸随温度变化的明显趋势。Perovskite 薄膜呈现出高斯趋势，显示出对温度的极端敏感性。CZTS 薄膜呈现双指数函数，最佳晶粒大小出现在 300°C 时。Sb2Se3 薄膜遵循幂律（~T6），晶粒大小在较高温度下迅速增大。这些随温度变化的行为为优化制造工艺和提高这些材料在光伏应用中的效率提供了启示。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Journal of Electronic Materials 工程技术-材料科学：综合

CiteScore

4.10

自引率

4.80%

发文量

693

审稿时长

3.8 months

期刊介绍： The Journal of Electronic Materials (JEM) reports monthly on the science and technology of electronic materials, while examining new applications for semiconductors, magnetic alloys, dielectrics, nanoscale materials, and photonic materials. The journal welcomes articles on methods for preparing and evaluating the chemical, physical, electronic, and optical properties of these materials. Specific areas of interest are materials for state-of-the-art transistors, nanotechnology, electronic packaging, detectors, emitters, metallization, superconductivity, and energy applications. Review papers on current topics enable individuals in the field of electronics to keep abreast of activities in areas peripheral to their own. JEM also selects papers from conferences such as the Electronic Materials Conference, the U.S. Workshop on the Physics and Chemistry of II-VI Materials, and the International Conference on Thermoelectrics. It benefits both specialists and non-specialists in the electronic materials field. A journal of The Minerals, Metals & Materials Society.