An Investigation on Thermoluminescence Properties of C6+ Ion Beam-Irradiated K2Ca2(SO4)3:Eu,Cu

IF 2.2 4区工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC

Journal of Electronic Materials Pub Date : 2024-10-25 DOI:10.1007/s11664-024-11549-0

Chirag Malik

引用次数: 0

Abstract

Potassium calcium sulfate (K₂Ca₂(SO₄)₃:Eu,Cu) co-doped with Eu²⁺ and Cu²⁺ (1000 ppm each) has been prepared by the co-precipitation method. Compound confirmation was carried out by X ray diffraction, and the average crystallite size was 61 nm, calculated by the Williamson–Hall plot method. The presence of dopants was confirmed by the photoluminescence emissions and excitation spectra. This nano-crystalline phosphor has been investigated for its dosimetric applications by studying its thermoluminescence (TL) properties after being irradiated with ion beams (C⁶⁺) at different fluences of different energies (65 MeV, 75 MeV, and 85 MeV). Also, the co-doped phosphor was compared with the singly-doped K₂Ca₂(SO₄)₃:Eu in terms of its TL intensities, and it showed a higher TL sensitivity. Moreover, it showed a good dose response only for a low-energy C⁶⁺ ion beam.

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硫酸钙钾（K2Ca2(SO4)3:Eu,Cu）通过共沉淀法制备出掺杂了 Eu2+ 和 Cu2+（各 1000 ppm）的硫酸钙钾（K2Ca2(SO4)3:Eu,Cu）。用 X 射线衍射法确认了化合物，用 Williamson-Hall plot 法计算出平均结晶尺寸为 61 nm。光致发光发射和激发光谱证实了掺杂剂的存在。通过研究这种纳米晶体荧光粉在不同能量（65 兆电子伏、75 兆电子伏和 85 兆电子伏）的离子束（C6+）辐照后的热致发光（TL）特性，对其剂量测定应用进行了研究。此外，就 TL 强度而言，共掺杂荧光粉与单掺杂 K2Ca2(SO4)3:Eu 相比，显示出更高的 TL 灵敏度。此外，它仅对低能量 C6+ 离子束表现出良好的剂量响应。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Journal of Electronic Materials 工程技术-材料科学：综合

CiteScore

4.10

自引率

4.80%

发文量

693

审稿时长

3.8 months

期刊介绍： The Journal of Electronic Materials (JEM) reports monthly on the science and technology of electronic materials, while examining new applications for semiconductors, magnetic alloys, dielectrics, nanoscale materials, and photonic materials. The journal welcomes articles on methods for preparing and evaluating the chemical, physical, electronic, and optical properties of these materials. Specific areas of interest are materials for state-of-the-art transistors, nanotechnology, electronic packaging, detectors, emitters, metallization, superconductivity, and energy applications. Review papers on current topics enable individuals in the field of electronics to keep abreast of activities in areas peripheral to their own. JEM also selects papers from conferences such as the Electronic Materials Conference, the U.S. Workshop on the Physics and Chemistry of II-VI Materials, and the International Conference on Thermoelectrics. It benefits both specialists and non-specialists in the electronic materials field. A journal of The Minerals, Metals & Materials Society.