One-Step Electrochemical Modification of Pencil Graphite Electrode with Poly(DPASA-co-VP)-RuO2NPs and its Application for the Trace Analysis of Sumatriptan

IF 2.2 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Mansoureh Lalei, Kobra Zarei
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引用次数: 0

Abstract

A straightforward and one-step modification of the pencil graphite electrode was performed using co-polymerization of diphenyl amine-4-sulfonic acid (DPASA) sodium salt, and 4-vinylpyridine (VP), and also simultaneous formation of ruthenium dioxide nanoparticles (poly(DPASA-co-VP)-RuO2 NPs/PGE). The subsequent step involved the application of the altered electrode to examine the quantity of sumatriptan by employing a highly sensitive adsorptive differential pulse voltammetric method. The modified electrode was thoroughly characterized through the utilization of cyclic voltammetry (CV), field-emission scanning electron microscopy (FESEM), and electrochemical impedance spectroscopy (EIS). Under optimized conditions, the concentration of sumatriptan was determined within two linear ranges: 1.0–50.0 nM and 50.0–5000.0 nM, with a detection limit of 0.03 nM. Ultimately, the suggested approach was employed to gauge the sumatriptan content in tablet and urine samples, revealing that this method possesses the requisite levels of accuracy and precision.

Abstract Image

聚(DPASA-co-VP)-RuO2NPs一步电化学修饰铅笔石墨电极及其在苏马曲坦痕量分析中的应用
用二苯胺-4-磺酸钠盐(DPASA)和4-乙烯基吡啶(VP)共聚合对铅笔石墨电极进行了直接的一步改性,并同时形成了二氧化钌纳米粒子(聚(DPASA-co-VP)-RuO2 NPs/PGE)。随后的步骤涉及应用改变电极,采用高灵敏度的吸附差分脉冲伏安法检查舒马曲坦的量。利用循环伏安法(CV)、场发射扫描电镜(FESEM)和电化学阻抗谱(EIS)对改性电极进行了全面表征。在优化条件下,舒马曲坦的浓度测定在1.0 ~ 50.0 nM和50.0 ~ 5000.0 nM两个线性范围内,检出限为0.03 nM。最后,该方法被用于测定片剂和尿样中的舒马曲坦含量,表明该方法具有必要的准确度和精密度。
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来源期刊
Journal of Electronic Materials
Journal of Electronic Materials 工程技术-材料科学:综合
CiteScore
4.10
自引率
4.80%
发文量
693
审稿时长
3.8 months
期刊介绍: The Journal of Electronic Materials (JEM) reports monthly on the science and technology of electronic materials, while examining new applications for semiconductors, magnetic alloys, dielectrics, nanoscale materials, and photonic materials. The journal welcomes articles on methods for preparing and evaluating the chemical, physical, electronic, and optical properties of these materials. Specific areas of interest are materials for state-of-the-art transistors, nanotechnology, electronic packaging, detectors, emitters, metallization, superconductivity, and energy applications. Review papers on current topics enable individuals in the field of electronics to keep abreast of activities in areas peripheral to their own. JEM also selects papers from conferences such as the Electronic Materials Conference, the U.S. Workshop on the Physics and Chemistry of II-VI Materials, and the International Conference on Thermoelectrics. It benefits both specialists and non-specialists in the electronic materials field. A journal of The Minerals, Metals & Materials Society.
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