Diagnosis of Incipient Electrical Defects on Long Cables Using a Chaotic Duffing Oscillator

IF 4.3 2区 综合性期刊 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC
Fabrice Auzanneau
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引用次数: 0

Abstract

Electrical wires are always present in critical modern systems, for the transmission of energy and signals. Due to aging or harsh environmental conditions, cables can develop defects that can reduce their performance and create severe problems. Reflectometry-based methods have been studied and implemented over the last 30 years and have shown good performance in detecting faults in cable networks. They rely on the analysis of echoes created by faults on the cable, and can detect defects whose echoes are a few percent of the input signal. But these methods are limited when it comes to detecting incipient faults characterized by echoes one order of magnitude smaller. This article presents the proof of concept of an entirely different diagnosis method. The method proposed here does not analyze the signal returned by the cable but uses this signal to disturb a system in an unstable equilibrium position. A chaotic Duffing oscillator is coupled to the cable under test and a test signal is sent into the cable: the returned signal is added to the oscillator control signal. The system parameters are chosen so that the oscillator is at the limit of stability, and a very slight disturbance of the cable causes a change in behavior that is much easier to detect than a very small peak sometimes drowned in noise on a reflectogram. The sensitivity of this new method is higher than that of state-of-the-art ones, enabling it to detect faults of signature of 1% or less of the amplitude of the test signal in long cables.
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来源期刊
IEEE Sensors Journal
IEEE Sensors Journal 工程技术-工程:电子与电气
CiteScore
7.70
自引率
14.00%
发文量
2058
审稿时长
5.2 months
期刊介绍: The fields of interest of the IEEE Sensors Journal are the theory, design , fabrication, manufacturing and applications of devices for sensing and transducing physical, chemical and biological phenomena, with emphasis on the electronics and physics aspect of sensors and integrated sensors-actuators. IEEE Sensors Journal deals with the following: -Sensor Phenomenology, Modelling, and Evaluation -Sensor Materials, Processing, and Fabrication -Chemical and Gas Sensors -Microfluidics and Biosensors -Optical Sensors -Physical Sensors: Temperature, Mechanical, Magnetic, and others -Acoustic and Ultrasonic Sensors -Sensor Packaging -Sensor Networks -Sensor Applications -Sensor Systems: Signals, Processing, and Interfaces -Actuators and Sensor Power Systems -Sensor Signal Processing for high precision and stability (amplification, filtering, linearization, modulation/demodulation) and under harsh conditions (EMC, radiation, humidity, temperature); energy consumption/harvesting -Sensor Data Processing (soft computing with sensor data, e.g., pattern recognition, machine learning, evolutionary computation; sensor data fusion, processing of wave e.g., electromagnetic and acoustic; and non-wave, e.g., chemical, gravity, particle, thermal, radiative and non-radiative sensor data, detection, estimation and classification based on sensor data) -Sensors in Industrial Practice
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