{"title":"Terahertz Time-Domain Characterization of Thin Conducting Films in Reflection Mode","authors":"Dimitrios C. Zografopoulos;Irnik Dionisiev;Nikolay Minev;Gaetana Petrone;Francesco Maita;Luca Maiolo;Dimitre Dimitrov;Vera Marinova;Andrea Liscio;Valentina Mussi;Romeo Beccherelli;Walter Fuscaldo","doi":"10.1109/TAP.2024.3482715","DOIUrl":null,"url":null,"abstract":"A protocol for the characterization of thin conducting films (TCSs) by means of terahertz time-domain spectroscopy (THz-TDS) is thoroughly presented. By employing a Gires-Tournoisétalon configuration in the reflection mode, it is shown that amplitude-only measurements are sufficient to accurately characterize the sheet resistance of thin films at THz frequencies thanks to the high sensitivity of the proposed technique. A large series of samples of nanometric thickness that span a broad range of sheet resistance values are characterized: fluorine-doped zinc oxide, aluminum-doped zinc oxide, nanometric titanium and reduced graphene oxide films, and tungsten and platinum diselenide. In addition, a flexible THz perfect absorber based on a Salisbury screen is experimentally demonstrated in the context of the analysis. The results confirm that THz-TDS in the reflection mode provides a powerful tool for the fast and nondestructive characterization of TCSs, such as transparent conducting oxides and emerging 2-D materials.","PeriodicalId":13102,"journal":{"name":"IEEE Transactions on Antennas and Propagation","volume":"72 12","pages":"9301-9316"},"PeriodicalIF":4.6000,"publicationDate":"2024-10-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10733828","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Antennas and Propagation","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10733828/","RegionNum":1,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
A protocol for the characterization of thin conducting films (TCSs) by means of terahertz time-domain spectroscopy (THz-TDS) is thoroughly presented. By employing a Gires-Tournoisétalon configuration in the reflection mode, it is shown that amplitude-only measurements are sufficient to accurately characterize the sheet resistance of thin films at THz frequencies thanks to the high sensitivity of the proposed technique. A large series of samples of nanometric thickness that span a broad range of sheet resistance values are characterized: fluorine-doped zinc oxide, aluminum-doped zinc oxide, nanometric titanium and reduced graphene oxide films, and tungsten and platinum diselenide. In addition, a flexible THz perfect absorber based on a Salisbury screen is experimentally demonstrated in the context of the analysis. The results confirm that THz-TDS in the reflection mode provides a powerful tool for the fast and nondestructive characterization of TCSs, such as transparent conducting oxides and emerging 2-D materials.
期刊介绍:
IEEE Transactions on Antennas and Propagation includes theoretical and experimental advances in antennas, including design and development, and in the propagation of electromagnetic waves, including scattering, diffraction, and interaction with continuous media; and applications pertaining to antennas and propagation, such as remote sensing, applied optics, and millimeter and submillimeter wave techniques