The Effect of Relative Humidity in Conductive Atomic Force Microscopy (Adv. Mater. 51/2024)

IF 27.4 1区材料科学 Q1 CHEMISTRY, MULTIDISCIPLINARY

Advanced Materials Pub Date : 2024-12-18 DOI:10.1002/adma.202470411

Yue Yuan, Mario Lanza

引用次数: 0

Abstract

Conductive Atomic Force Microscopy

In article number 2405932, Yue Yuan and Mario Lanza clarify what is the effect of relative humidity in conductive atomic force microscopy. They measure over 17,000 different locations on the surface of ten different samples (insulating, semiconducting and conducting) under seven different relative humidity levels. In insulators and thick (>5 nm) semiconductors, the water meniscus at the tip/sample junction increases the currents registered.

Abstract Image

查看原文本刊更多论文

导电原子力显微镜

本文章由计算机程序翻译，如有差异，请以英文原文为准。

求助全文

约1分钟内获得全文求助全文

来源期刊

Advanced Materials 工程技术-材料科学：综合

CiteScore

43.00

自引率

4.10%

发文量

2182

审稿时长

2 months

期刊介绍： Advanced Materials, one of the world's most prestigious journals and the foundation of the Advanced portfolio, is the home of choice for best-in-class materials science for more than 30 years. Following this fast-growing and interdisciplinary field, we are considering and publishing the most important discoveries on any and all materials from materials scientists, chemists, physicists, engineers as well as health and life scientists and bringing you the latest results and trends in modern materials-related research every week.