Capillary Force-Assisted CsPbBr3–xIx (x = 0, 1) Columnar Crystal Film for X-ray Detectors with Ultrahigh Electric Field and Sensitivity

IF 8.3 2区材料科学 Q1 MATERIALS SCIENCE, MULTIDISCIPLINARY

ACS Applied Materials & Interfaces Pub Date : 2024-12-18 DOI:10.1021/acsami.4c18212

Sixin Chen, Meng Xu, Zhaolin Song, Yiran Shi, Ruichen Bai, Wanqi Jie, Menghua Zhu

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Abstract

Inorganic halide perovskite thin-film X-ray detectors have attracted great research interest in recent years due to their high sensitivity, low detection limit, and facile fabrication process. The poor crystal quality of the thin film with uncontrollable thickness and low background voltage during detection limits its practical application. Here, a high-quality CsPbBr_3–xI_x (x = 0, 1) columnar crystal film is prepared by an improved melt-confined method with a porous anodic aluminum oxide (AAO) template, which stabilizes the disorder perovskite systems of CsPbBr₂I by stress. The AAO-CsPbBr_3–xI_x (x = 0) detectors exhibit high detection accuracy and photoelectric conversion capability with an ultrahigh sensitivity of 32,399.5 μC·Gy_air^–1·cm^–2 at 2142.9 V mm^–1 under 20 kV_p X-rays and 19,217.4 μC·Gy_air^–1·cm^–2 with a higher background electric field of 6666.7 V mm^–1 for AAO-CsPbBr_3–xI_x (x = 1). Moreover, the AAO-CsPbBr_3–xI_x (x = 1) film detector acquires a lower detection limit of 7.65 nGy·s^–1 and a higher X-ray imaging spatial resolution of 1.6 LP/mm and 8.6 nGy·s^–1 and 1.4 LP/mm for AAO-CsPbBr_3–xI_x (x = 0). The facile, high-quality columnar crystal film devices display great potential for low-energy and low-dose X-ray imaging in flat panel detection applications.

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近年来，无机卤化物过氧化物薄膜 X 射线探测器以其高灵敏度、低检测限和简便的制造工艺引起了人们极大的研究兴趣。但由于薄膜晶体质量差，厚度不可控，探测时本底电压低，限制了其实际应用。本文采用改进的熔融约束法制备了高质量的 CsPbBr3-xIx（x = 0，1）柱状晶薄膜，该薄膜以多孔阳极氧化铝（AAO）为模板，通过应力稳定了 CsPbBr2I 的无序包晶系。AAO-CsPbBr3-xIx (x = 0) 探测器具有很高的探测精度和光电转换能力，在 20 kVp X 射线下 2142.9 V mm-1 时的灵敏度高达 32,399.5 μC-Gyair-1-cm-2，而 AAO-CsPbBr3-xIx (x = 1) 在 6666.7 V mm-1 的较高背景电场下的灵敏度为 19,217.4 μC-Gyair-1-cm-2。此外，AAO-CsPbBr3-xIx（x = 1）薄膜探测器的探测极限较低，为 7.65 nGy-s-1，X 射线成像空间分辨率较高，为 1.6 LP/mm，而 AAO-CsPbBr3-xIx （x = 0）的探测极限和空间分辨率分别为 8.6 nGy-s-1 和 1.4 LP/mm。这种简便、高质量的柱状晶体薄膜器件在平板检测应用中的低能量、低剂量 X 射线成像方面显示出巨大的潜力。

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来源期刊

ACS Applied Materials & Interfaces 工程技术-材料科学：综合

CiteScore

16.00

自引率

6.30%

发文量

4978

审稿时长

1.8 months

期刊介绍： ACS Applied Materials & Interfaces is a leading interdisciplinary journal that brings together chemists, engineers, physicists, and biologists to explore the development and utilization of newly-discovered materials and interfacial processes for specific applications. Our journal has experienced remarkable growth since its establishment in 2009, both in terms of the number of articles published and the impact of the research showcased. We are proud to foster a truly global community, with the majority of published articles originating from outside the United States, reflecting the rapid growth of applied research worldwide.