Thermal Rectification in Telescopic Nanowires: Impact of Thermal Boundary Resistance

IF 8.3 2区 材料科学 Q1 MATERIALS SCIENCE, MULTIDISCIPLINARY
Yashpreet Kaur, Saeko Tachikawa, Milo Yaro Swinkels, Miquel López-Suárez, Matteo Camponovo, Alicia Ruiz Caridad, Wonjong Kim, Anna Fontcuberta i Morral, Riccardo Rurali, Ilaria Zardo
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Abstract

A thermal diode, which, by analogy to its electrical counterpart, rectifies heat current, is the building block for thermal circuits. To realize a thermal diode, we demonstrate thermal rectification in a GaAs telescopic nanowire system using the thermal bridge method. We measured a preferred direction of heat flux, achieving rectification values ranging from 2 to 8% as a function of applied thermal bias. We demonstrate that the thermal boundary resistance between the thin part with the wurtzite crystal phase and the thick part with the zinc-blende crystal phase of the telescopic nanowire plays a crucial role in determining the amount and direction of heat flux rectification. This effect is confirmed by numerical solutions of the one-dimensional heat equation based on ab initio data. Additionally, we accounted for the effect of the thermal contact resistance. This work is the first experimental indication of rectification using a telescopic nanowire where we reveal the importance and role of the thermal boundary resistance in determining thermal rectification.

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来源期刊
ACS Applied Materials & Interfaces
ACS Applied Materials & Interfaces 工程技术-材料科学:综合
CiteScore
16.00
自引率
6.30%
发文量
4978
审稿时长
1.8 months
期刊介绍: ACS Applied Materials & Interfaces is a leading interdisciplinary journal that brings together chemists, engineers, physicists, and biologists to explore the development and utilization of newly-discovered materials and interfacial processes for specific applications. Our journal has experienced remarkable growth since its establishment in 2009, both in terms of the number of articles published and the impact of the research showcased. We are proud to foster a truly global community, with the majority of published articles originating from outside the United States, reflecting the rapid growth of applied research worldwide.
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