Structure of Surface Steps in the Deformed Zr62Cu22Fe6Al10 Amorphous Alloy

IF 0.5 Q4 PHYSICS, CONDENSED MATTER
G. E. Abrosimova, N. A. Volkov, A. S. Aronin
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引用次数: 0

Abstract

The structure of the side surfaces of the bulk Zr62Cu22Fe6Al10 amorphous alloy before and after compressive deformation at room temperature was studied using X-ray diffraction and scanning electron microscopy (SEM) methods. After preparation, the samples of the amorphous alloy had a square cross section of 5 × 5 mm and a length of 40 mm. Examining the side surfaces of the samples allows one to avoid influencing the surface structure of a tool used for deformation. The plastic deformation of amorphous alloys occurs through the formation and propagation of shear bands. During compressive deformation at room temperature, a system of steps was formed on the end surfaces of the sample caused by shear bands coming to the surface. Steps on surfaces have different sizes (thickness and height). It was established that the structure of large steps is complex: they consist of elementary steps 15–30 nm thick. The local deformation was estimated based on the size of the steps. The formation of a small number of nanocrystals during deformation was discovered. The nanocrystals are approximately 10 nm in size. The results obtained open a new direction for research into the structure of deformed amorphous alloys and nanocrystallization processes under the influence of deformation.

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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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