On Anomalous Diffusion of Fast Electrons through the Silicon Crystal

IF 0.5 Q4 PHYSICS, CONDENSED MATTER
V. V. Syshchenko, A. I. Tarnovsky, V. I. Dronik
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引用次数: 0

Abstract

Anomalous diffusion is a random process in which the root-mean-square displacement of a particle from the starting point depends nonlinearly on time. The possibility of such behavior for high-energy particles moving through the crystal under conditions close to axial channeling was found earlier. In this case, the rapid displacement of particles in a plane transverse to atomic strings (Lévi flights) is due to the temporary capture of the particles in planar channels. In this work, the anomalous diffusion exponent has been found by numerical simulation for different values of the energy of electron transverse motion in the (100) plane of a silicon crystal. It has been shown that, in the case of electrons with an energy exceeding by 1 eV the height of the saddle point of the potential of a system of atomic chains [100], the results are consistent with those obtained earlier. It has been confirmed that the anomalous nature of diffusion is due to the possibility of short-term capture of particles in planar channels. With increasing transverse energy, this possibility disappears and the diffusion becomes normal (Brownian).

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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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